FSAF: File system aware flash translation layer for NAND flash memories

Sai Krishna Mylavarapu, Siddharth Choudhuri, Aviral Shrivastava, Lee Jongeun, Tony Givargis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

NAND Flash Memories require Garbage Collection (GC) and Wear Leveling (WL) operations to be carried out by Flash Translation Layers (FTLs) that oversee flash management. Owing to expensive erasures and data copying, these two operations essentially determine application response times. Since file systems do not share any file deletion information with FTL, dead data is treated as valid by FTL, resulting in significant WL and GC overheads. In this work, we propose a novel method to dynamically interpret and treat dead data at the FTL level so as to reduce above overheads and improve application response times, without necessitating any changes to existing file systems. We demonstrate that our resourceefficient approach can improve application response times and memory write access times by 22% and reduce erasures by 21.6% on average.

Original languageEnglish (US)
Title of host publicationProceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages399-404
Number of pages6
ISBN (Print)9783981080155
DOIs
StatePublished - 2009
Event2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09 - Nice, France
Duration: Apr 20 2009Apr 24 2009

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
Country/TerritoryFrance
CityNice
Period4/20/094/24/09

ASJC Scopus subject areas

  • Engineering(all)

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