Frequency independent method for rcs reduction of dihedral corners using metasurfaces

Anuj Y. Modi, Constantine A. Balanis, Craig R. Birtcher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Using orthogonality principles and array theory, a frequency independent method for reducing the Radar Cross Section (RCS) in the entire concave region of dihedral corners is developed and validated. The proposed technique can further be applied for broadband RCS reduction of complex corners and open-ended cavities where fields undergo multiple bounces.

Original languageEnglish (US)
Title of host publication2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1325-1326
Number of pages2
ISBN (Electronic)9781728106922
DOIs
StatePublished - Jul 2019
Externally publishedYes
Event2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Atlanta, United States
Duration: Jul 7 2019Jul 12 2019

Publication series

Name2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings

Conference

Conference2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019
CountryUnited States
CityAtlanta
Period7/7/197/12/19

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Instrumentation

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    Modi, A. Y., Balanis, C. A., & Birtcher, C. R. (2019). Frequency independent method for rcs reduction of dihedral corners using metasurfaces. In 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings (pp. 1325-1326). [8889101] (2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APUSNCURSINRSM.2019.8889101