Abstract
A model for free-carrier relaxation, including dispersion in the dielectric function of the host is developed for a-Si and a-Si:H. The model is applicable for probe-beam pulse energies in the spectral regime of the absorption edge, from ∼1-3 eV.
Original language | English (US) |
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Pages (from-to) | 579-581 |
Number of pages | 3 |
Journal | Journal of Non-Crystalline Solids |
Volume | 114 |
Issue number | PART 2 |
DOIs | |
State | Published - Dec 2 1989 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry