Four stages of defect creation in epitaxial structures: High resolution x-ray diffraction and transmission electron microscopy characterization

Nikolai N. Faleev, Christiana Honsberg, David Smith

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'Four stages of defect creation in epitaxial structures: High resolution x-ray diffraction and transmission electron microscopy characterization'. Together they form a unique fingerprint.

Engineering & Materials Science