Abstract
The synthesis of metal silicides in a cavity applicator microwave system was studied. The silicide phase present and the layer thicknesses were identified by using x-ray diffraction, Rutherford backscattering spectrometry and four-point-probe measurements. It was found that the products attained from heating by microwaves do not differ much from those attained in heating by thermal processes.
Original language | English (US) |
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Pages (from-to) | 3918-3920 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 19 |
DOIs | |
State | Published - Nov 10 2003 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)