Formation of complex alkoxides to control layer structure in Sr-Bi-M-O (M: Ta or Nb) perovskite thin films

K. Kato, C. Zheng, J. M. Finder, Sandwip Dey, Y. Torii

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Precursors for layer-structured perovskite thin films of Sr2Bi2Ta3O12.5 or SBT223, and Sr2Bi2Nb3O12.5 or SBN223 were prepared by the reactions of Sr-Bi (2:2) double methoxyethoxide and Ta or Nb methoxyethoxide, followed by partial hydrolysis. By several analytical techniques, such as 1H-, 13C- and 93Nb-NMR (nuclear magnetic resonance) and FT-IR (Fourier transform infrared) the molecular structure of the precursors was found to be similar to the layer-structured perovskite crystal sub-lattice. As a result, the onset of crystallization in the sol-gel derived SBT223 thin films was at a low temperature of 550 °C. By rapid thermal annealing in an oxygen atmosphere, the single-phase perovskite films exhibited preferred (1 1 7) orientation. In contrast to the SBT system, the observed number of the pseudo-perovskite layers of TaO6 octahedral units between Bi2O2 2+ layers in the SBT223 was three. Despite the elongation of the unit cell along the c-axis, 700 °C-heated SBT223 thin film did not exhibit a saturated hysteresis loop due to the small crystallite size.

Original languageEnglish (US)
Pages (from-to)457-464
Number of pages8
JournalJournal of Materials Science: Materials in Electronics
Volume9
Issue number6
DOIs
StatePublished - Dec 1998

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alkoxides
Perovskite
Thin films
thin films
Nuclear magnetic resonance
nuclear magnetic resonance
Rapid thermal annealing
Polymethyl Methacrylate
Fourier Analysis
Crystallite size
Hysteresis loops
Crystallization
Molecular Structure
Atmosphere
Crystal lattices
Molecular structure
elongation
Sol-gels
hydrolysis
Elongation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Formation of complex alkoxides to control layer structure in Sr-Bi-M-O (M : Ta or Nb) perovskite thin films. / Kato, K.; Zheng, C.; Finder, J. M.; Dey, Sandwip; Torii, Y.

In: Journal of Materials Science: Materials in Electronics, Vol. 9, No. 6, 12.1998, p. 457-464.

Research output: Contribution to journalArticle

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