Force-detected magnetic resonance in a field gradient of 250 000 Tesla per meter

K. J. Bruland, W. M. Dougherty, J. L. Garbini, J. A. Sidles, Shih-Hui Chao

Research output: Contribution to journalArticle

51 Citations (Scopus)

Abstract

We report the detection of slice-selective electron spin resonance with an external magnetic field gradient comparable to local interatomic gradients, using the techniques of magnetic resonance force microscopy. An applied microwave field modulated the spin-gradient force between a paramagnetic DPPH sample and a micrometer-scale ferromagnetic tip on a force microscope cantilever. A sensitivity equivalent to 184 polarized electron moments in a one-Hertz detection bandwidth was attained. We mapped the tip magnetic field with a resonant slice thickness of order one nanometer, thereby demonstrating magnetic resonance on length scales comparable to molecular dimensions.

Original languageEnglish (US)
Pages (from-to)3159-3161
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number21
DOIs
StatePublished - Dec 1 1998
Externally publishedYes

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magnetic resonance
gradients
magnetic fields
micrometers
electron paramagnetic resonance
microscopes
microscopy
bandwidth
moments
microwaves
sensitivity
electrons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Force-detected magnetic resonance in a field gradient of 250 000 Tesla per meter. / Bruland, K. J.; Dougherty, W. M.; Garbini, J. L.; Sidles, J. A.; Chao, Shih-Hui.

In: Applied Physics Letters, Vol. 73, No. 21, 01.12.1998, p. 3159-3161.

Research output: Contribution to journalArticle

Bruland, K. J. ; Dougherty, W. M. ; Garbini, J. L. ; Sidles, J. A. ; Chao, Shih-Hui. / Force-detected magnetic resonance in a field gradient of 250 000 Tesla per meter. In: Applied Physics Letters. 1998 ; Vol. 73, No. 21. pp. 3159-3161.
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