Force-detected magnetic resonance in a field gradient of 250 000 Tesla per meter

K. J. Bruland, W. M. Dougherty, J. L. Garbini, J. A. Sidles, S. H. Chao

Research output: Contribution to journalArticle

51 Scopus citations

Abstract

We report the detection of slice-selective electron spin resonance with an external magnetic field gradient comparable to local interatomic gradients, using the techniques of magnetic resonance force microscopy. An applied microwave field modulated the spin-gradient force between a paramagnetic DPPH sample and a micrometer-scale ferromagnetic tip on a force microscope cantilever. A sensitivity equivalent to 184 polarized electron moments in a one-Hertz detection bandwidth was attained. We mapped the tip magnetic field with a resonant slice thickness of order one nanometer, thereby demonstrating magnetic resonance on length scales comparable to molecular dimensions.

Original languageEnglish (US)
Pages (from-to)3159-3161
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number21
DOIs
StatePublished - Dec 1 1998
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Bruland, K. J., Dougherty, W. M., Garbini, J. L., Sidles, J. A., & Chao, S. H. (1998). Force-detected magnetic resonance in a field gradient of 250 000 Tesla per meter. Applied Physics Letters, 73(21), 3159-3161. https://doi.org/10.1063/1.122705