FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS.

H. Alexander, John Spence, D. Shindo, H. Gottschalk, N. Long

Research output: Contribution to journalArticle

45 Citations (Scopus)

Abstract

High-resolution electron microscope lattice images have been obtained at the Scherzer focus setting for the first time from the 'forbidden' left brace 4 OVER BAR 22 right brace /3 Bragg reflections which result from intrinsic stacking faults (lying normal to the beam) in thin crystals of silicon. Microdiffraction patterns have also been obtained from stacking faults normal to the beam, showing these reflections. The boundaries of the SF lattice image delineate the approximate location of partial dislocation cores running normal to the beam, and these reveal a high density of directional fluctuations, despite their appearance as straight dislocations in the corresponding weak-beam images. The effects of surface roughness on an atomic scale are discussed, and this is shown to limit the accuracy with which the partial dislocation cores can be located to within a few angstroms.

Original languageEnglish (US)
Pages (from-to)627-643
Number of pages17
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume53
Issue number5 pt 1
StatePublished - May 1986

Fingerprint

Stacking faults
Imaging techniques
Silicon
crystal defects
Electron microscopes
Surface roughness
Crystals
surface roughness
electron microscopes
high resolution
silicon
crystals

ASJC Scopus subject areas

  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Metals and Alloys
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

Cite this

FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS. / Alexander, H.; Spence, John; Shindo, D.; Gottschalk, H.; Long, N.

In: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, Vol. 53, No. 5 pt 1, 05.1986, p. 627-643.

Research output: Contribution to journalArticle

@article{97b52772bc5f4db0a401fdb40336d7e6,
title = "FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS.",
abstract = "High-resolution electron microscope lattice images have been obtained at the Scherzer focus setting for the first time from the 'forbidden' left brace 4 OVER BAR 22 right brace /3 Bragg reflections which result from intrinsic stacking faults (lying normal to the beam) in thin crystals of silicon. Microdiffraction patterns have also been obtained from stacking faults normal to the beam, showing these reflections. The boundaries of the SF lattice image delineate the approximate location of partial dislocation cores running normal to the beam, and these reveal a high density of directional fluctuations, despite their appearance as straight dislocations in the corresponding weak-beam images. The effects of surface roughness on an atomic scale are discussed, and this is shown to limit the accuracy with which the partial dislocation cores can be located to within a few angstroms.",
author = "H. Alexander and John Spence and D. Shindo and H. Gottschalk and N. Long",
year = "1986",
month = "5",
language = "English (US)",
volume = "53",
pages = "627--643",
journal = "Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties",
issn = "0141-8610",
publisher = "Taylor and Francis Ltd.",
number = "5 pt 1",

}

TY - JOUR

T1 - FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS.

AU - Alexander, H.

AU - Spence, John

AU - Shindo, D.

AU - Gottschalk, H.

AU - Long, N.

PY - 1986/5

Y1 - 1986/5

N2 - High-resolution electron microscope lattice images have been obtained at the Scherzer focus setting for the first time from the 'forbidden' left brace 4 OVER BAR 22 right brace /3 Bragg reflections which result from intrinsic stacking faults (lying normal to the beam) in thin crystals of silicon. Microdiffraction patterns have also been obtained from stacking faults normal to the beam, showing these reflections. The boundaries of the SF lattice image delineate the approximate location of partial dislocation cores running normal to the beam, and these reveal a high density of directional fluctuations, despite their appearance as straight dislocations in the corresponding weak-beam images. The effects of surface roughness on an atomic scale are discussed, and this is shown to limit the accuracy with which the partial dislocation cores can be located to within a few angstroms.

AB - High-resolution electron microscope lattice images have been obtained at the Scherzer focus setting for the first time from the 'forbidden' left brace 4 OVER BAR 22 right brace /3 Bragg reflections which result from intrinsic stacking faults (lying normal to the beam) in thin crystals of silicon. Microdiffraction patterns have also been obtained from stacking faults normal to the beam, showing these reflections. The boundaries of the SF lattice image delineate the approximate location of partial dislocation cores running normal to the beam, and these reveal a high density of directional fluctuations, despite their appearance as straight dislocations in the corresponding weak-beam images. The effects of surface roughness on an atomic scale are discussed, and this is shown to limit the accuracy with which the partial dislocation cores can be located to within a few angstroms.

UR - http://www.scopus.com/inward/record.url?scp=0022720534&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022720534&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0022720534

VL - 53

SP - 627

EP - 643

JO - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

JF - Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

SN - 0141-8610

IS - 5 pt 1

ER -