Flying and decoupling capacitance optimization for area-constrained on-chip switched-capacitor voltage regulators

Xiaoyang Mi, Hesam Fathi Moghadam, Jae-sun Seo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Switched-capacitor voltage regulators (SCVRs) are widely used in on-chip power management, due to high step-down efficiency and feasibility of integration. In this work, we present theoretical analysis and optimization methodology for flying and decoupling capacitance values for area-constrained on-chip SCVRs to achieve the highest system-level power efficiency. The proposed models for efficiency and droop voltage are validated with on-chip 2:1 SCVR implementations in both 65nm and 32nm CMOS, which show high model accuracy. The maximum and average error of the predicted optimal ratio between flying and decoupling capacitance are 5% and 1.7%, respectively.

Original languageEnglish (US)
Title of host publicationProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1269-1272
Number of pages4
ISBN (Electronic)9783981537093
DOIs
StatePublished - May 11 2017
Event20th Design, Automation and Test in Europe, DATE 2017 - Swisstech, Lausanne, Switzerland
Duration: Mar 27 2017Mar 31 2017

Other

Other20th Design, Automation and Test in Europe, DATE 2017
CountrySwitzerland
CitySwisstech, Lausanne
Period3/27/173/31/17

Keywords

  • Area-constrained power management
  • Capacitance optimization
  • Integrated voltage regulator
  • Power conversion efficiency
  • Switched-capacitor voltage converter
  • Voltage droop

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Mi, X., Moghadam, H. F., & Seo, J. (2017). Flying and decoupling capacitance optimization for area-constrained on-chip switched-capacitor voltage regulators. In Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017 (pp. 1269-1272). [7927186] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2017.7927186