Fluctuation X-ray microscopy for measuring medium-range order

Lixin Fan, Ian McNulty, David Paterson, Michael Treacy, J. Murray Gibson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Many x-ray techniques exist to probe long- and short-range order in matter, in real space by imaging and in reciprocal space by diffraction and scattering. However, measuring medium-range order (MRO) in disordered materials is a long-standing problem. Based on fluctuation electron microscopy, which was applied successfully to the understanding of MRO in amorphous materials, we have developed fluctuation x-ray microscopy (FXM). This novel approach offers quantitative insight into medium-range correlations in materials at nanometer and larger length scales. It examines spatially resolved fluctuations in the intensity of a series of x-ray speckle patterns. The speckle variance depends on higher order correlations that are more sensitive to MRO. Systematically measuring the speckle variance as function of the momentum transfer and x-ray illumination size produces a fluctuation map that contains information about the degree of MRO and the correlation length. This approach can be used for the exploration of MRO and subtle spatial structural changes in a wide range of disordered materials from soft condensed matter to nanowire arrays, semiconductor quantum dot arrays and magnetic materials. It will also help us to understand the mechanisms of order-disorder transitions and may lead to control of ordering, which is important in developing ordered structures tailored for particular applications. A theory for FXM and preliminary experimental results from polystyrene latex spheres are discussed in this paper.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
EditorsS.R. Bhatia, P.G. Khalifah, D.J. Pochan, P.G. Radaelli
Pages137-142
Number of pages6
Volume840
StatePublished - 2005
EventNeutron and X-Ray Scattering as Probes of Multiscale Phenomena - Boston, MA, United States
Duration: Nov 29 2004Dec 1 2004

Other

OtherNeutron and X-Ray Scattering as Probes of Multiscale Phenomena
CountryUnited States
CityBoston, MA
Period11/29/0412/1/04

Fingerprint

Microscopic examination
X rays
Speckle
Order disorder transitions
Momentum transfer
Magnetic materials
Latexes
Electron microscopy
Semiconductor quantum dots
Nanowires
Polystyrenes
Diffraction
Lighting
Scattering
Imaging techniques

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Fan, L., McNulty, I., Paterson, D., Treacy, M., & Murray Gibson, J. (2005). Fluctuation X-ray microscopy for measuring medium-range order. In S. R. Bhatia, P. G. Khalifah, D. J. Pochan, & P. G. Radaelli (Eds.), Materials Research Society Symposium Proceedings (Vol. 840, pp. 137-142). [Q6.7]

Fluctuation X-ray microscopy for measuring medium-range order. / Fan, Lixin; McNulty, Ian; Paterson, David; Treacy, Michael; Murray Gibson, J.

Materials Research Society Symposium Proceedings. ed. / S.R. Bhatia; P.G. Khalifah; D.J. Pochan; P.G. Radaelli. Vol. 840 2005. p. 137-142 Q6.7.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fan, L, McNulty, I, Paterson, D, Treacy, M & Murray Gibson, J 2005, Fluctuation X-ray microscopy for measuring medium-range order. in SR Bhatia, PG Khalifah, DJ Pochan & PG Radaelli (eds), Materials Research Society Symposium Proceedings. vol. 840, Q6.7, pp. 137-142, Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, Boston, MA, United States, 11/29/04.
Fan L, McNulty I, Paterson D, Treacy M, Murray Gibson J. Fluctuation X-ray microscopy for measuring medium-range order. In Bhatia SR, Khalifah PG, Pochan DJ, Radaelli PG, editors, Materials Research Society Symposium Proceedings. Vol. 840. 2005. p. 137-142. Q6.7
Fan, Lixin ; McNulty, Ian ; Paterson, David ; Treacy, Michael ; Murray Gibson, J. / Fluctuation X-ray microscopy for measuring medium-range order. Materials Research Society Symposium Proceedings. editor / S.R. Bhatia ; P.G. Khalifah ; D.J. Pochan ; P.G. Radaelli. Vol. 840 2005. pp. 137-142
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