Fluctuation X-ray microscopy: A novel approach for the structural study of disordered materials

L. Fan, D. Paterson, I. McNulty, Michael Treacy, J. M. Gibson

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Measuring medium-range order is a challenging and important problem in the structural study of disordered materials. We have developed a new technique, fluctuation x-ray microscopy, that offers quantitative insight into medium-range correlations in disordered materials at nanometre and larger length scales.In this technique, which requires a spatially coherent x-ray beam, a series of speckle patterns are measured at a large number of locations in a sample using various illumination sizes. Examination of the speckle variance as a function of the illumination spot size allows the structural correlation length to be measured. To demonstrate this technique we have studied polystyrene latex spheres, which serve as a model for a dense random-packed glass, and for the first time have measured the correlation length in a disordered system by fluctuation X-ray microscopy. We discuss data analysis and procedures to correct for shot noise and detector noise. This approach could be used to explore medium-range order and subtle spatial structural changes in a wide range of disordered materials, from soft matter to nanowire arrays, semiconductor quantum dot arrays and magnetic materials.

Original languageEnglish (US)
Pages (from-to)41-48
Number of pages8
JournalJournal of Microscopy
Volume225
Issue number1
DOIs
StatePublished - Jan 2007

Fingerprint

Microscopy
Microscopic examination
X-Rays
Speckle
microscopy
Lighting
X rays
illumination
Nanowires
Quantum Dots
Shot noise
Semiconductors
x rays
Magnetic materials
speckle patterns
shot noise
latex
magnetic materials
Latexes
Microspheres

Keywords

  • Coherent scattering
  • Disordered materials
  • Fluctuation X-ray microscopy
  • Medium-range order
  • Speckle

ASJC Scopus subject areas

  • Instrumentation

Cite this

Fluctuation X-ray microscopy : A novel approach for the structural study of disordered materials. / Fan, L.; Paterson, D.; McNulty, I.; Treacy, Michael; Gibson, J. M.

In: Journal of Microscopy, Vol. 225, No. 1, 01.2007, p. 41-48.

Research output: Contribution to journalArticle

Fan, L. ; Paterson, D. ; McNulty, I. ; Treacy, Michael ; Gibson, J. M. / Fluctuation X-ray microscopy : A novel approach for the structural study of disordered materials. In: Journal of Microscopy. 2007 ; Vol. 225, No. 1. pp. 41-48.
@article{ab81fff0a8a448c280eea105e3a39c20,
title = "Fluctuation X-ray microscopy: A novel approach for the structural study of disordered materials",
abstract = "Measuring medium-range order is a challenging and important problem in the structural study of disordered materials. We have developed a new technique, fluctuation x-ray microscopy, that offers quantitative insight into medium-range correlations in disordered materials at nanometre and larger length scales.In this technique, which requires a spatially coherent x-ray beam, a series of speckle patterns are measured at a large number of locations in a sample using various illumination sizes. Examination of the speckle variance as a function of the illumination spot size allows the structural correlation length to be measured. To demonstrate this technique we have studied polystyrene latex spheres, which serve as a model for a dense random-packed glass, and for the first time have measured the correlation length in a disordered system by fluctuation X-ray microscopy. We discuss data analysis and procedures to correct for shot noise and detector noise. This approach could be used to explore medium-range order and subtle spatial structural changes in a wide range of disordered materials, from soft matter to nanowire arrays, semiconductor quantum dot arrays and magnetic materials.",
keywords = "Coherent scattering, Disordered materials, Fluctuation X-ray microscopy, Medium-range order, Speckle",
author = "L. Fan and D. Paterson and I. McNulty and Michael Treacy and Gibson, {J. M.}",
year = "2007",
month = "1",
doi = "10.1111/j.1365-2818.2007.01714.x",
language = "English (US)",
volume = "225",
pages = "41--48",
journal = "Journal of Microscopy",
issn = "0022-2720",
publisher = "Wiley-Blackwell",
number = "1",

}

TY - JOUR

T1 - Fluctuation X-ray microscopy

T2 - A novel approach for the structural study of disordered materials

AU - Fan, L.

AU - Paterson, D.

AU - McNulty, I.

AU - Treacy, Michael

AU - Gibson, J. M.

PY - 2007/1

Y1 - 2007/1

N2 - Measuring medium-range order is a challenging and important problem in the structural study of disordered materials. We have developed a new technique, fluctuation x-ray microscopy, that offers quantitative insight into medium-range correlations in disordered materials at nanometre and larger length scales.In this technique, which requires a spatially coherent x-ray beam, a series of speckle patterns are measured at a large number of locations in a sample using various illumination sizes. Examination of the speckle variance as a function of the illumination spot size allows the structural correlation length to be measured. To demonstrate this technique we have studied polystyrene latex spheres, which serve as a model for a dense random-packed glass, and for the first time have measured the correlation length in a disordered system by fluctuation X-ray microscopy. We discuss data analysis and procedures to correct for shot noise and detector noise. This approach could be used to explore medium-range order and subtle spatial structural changes in a wide range of disordered materials, from soft matter to nanowire arrays, semiconductor quantum dot arrays and magnetic materials.

AB - Measuring medium-range order is a challenging and important problem in the structural study of disordered materials. We have developed a new technique, fluctuation x-ray microscopy, that offers quantitative insight into medium-range correlations in disordered materials at nanometre and larger length scales.In this technique, which requires a spatially coherent x-ray beam, a series of speckle patterns are measured at a large number of locations in a sample using various illumination sizes. Examination of the speckle variance as a function of the illumination spot size allows the structural correlation length to be measured. To demonstrate this technique we have studied polystyrene latex spheres, which serve as a model for a dense random-packed glass, and for the first time have measured the correlation length in a disordered system by fluctuation X-ray microscopy. We discuss data analysis and procedures to correct for shot noise and detector noise. This approach could be used to explore medium-range order and subtle spatial structural changes in a wide range of disordered materials, from soft matter to nanowire arrays, semiconductor quantum dot arrays and magnetic materials.

KW - Coherent scattering

KW - Disordered materials

KW - Fluctuation X-ray microscopy

KW - Medium-range order

KW - Speckle

UR - http://www.scopus.com/inward/record.url?scp=33846797812&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33846797812&partnerID=8YFLogxK

U2 - 10.1111/j.1365-2818.2007.01714.x

DO - 10.1111/j.1365-2818.2007.01714.x

M3 - Article

C2 - 17286694

AN - SCOPUS:33846797812

VL - 225

SP - 41

EP - 48

JO - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

IS - 1

ER -