Fluctuation microscopy with electrons or X-rays: Insight into medium-range order

J. M. Gibson, Michael Treacy, L. Fan, I. McNulty, D. Paterson

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)806-807
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - 2004

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Microscopic examination
microscopy
X rays
Electrons
electrons
x rays

ASJC Scopus subject areas

  • Instrumentation

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Fluctuation microscopy with electrons or X-rays : Insight into medium-range order. / Gibson, J. M.; Treacy, Michael; Fan, L.; McNulty, I.; Paterson, D.

In: Microscopy and Microanalysis, Vol. 10, No. SUPPL. 2, 2004, p. 806-807.

Research output: Contribution to journalArticle

Gibson, J. M. ; Treacy, Michael ; Fan, L. ; McNulty, I. ; Paterson, D. / Fluctuation microscopy with electrons or X-rays : Insight into medium-range order. In: Microscopy and Microanalysis. 2004 ; Vol. 10, No. SUPPL. 2. pp. 806-807.
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