Fluctuation microscopy with electrons or X-rays: Insight into medium-range order

J. M. Gibson; Michael Treacy; L. Fan; I. McNulty; D. Paterson

doi:10.1017/S1431927604884861

Fluctuation microscopy with electrons or X-rays: Insight into medium-range order

J. M. Gibson, Michael Treacy, L. Fan, I. McNulty, D. Paterson

Physics

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	806-807
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604884861
State	Published - Sep 27 2004

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927604884861

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title = "Fluctuation microscopy with electrons or X-rays: Insight into medium-range order",

author = "Gibson, {J. M.} and Michael Treacy and L. Fan and I. McNulty and D. Paterson",

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AU - Treacy, Michael

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AU - McNulty, I.

AU - Paterson, D.

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Fluctuation microscopy with electrons or X-rays: Insight into medium-range order

ASJC Scopus subject areas

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