Fluctuation microscopy - A tool for examining medium-range order in noncrystalline systems

L. Fan, I. McNulty, D. Paterson, Michael Treacy, J. M. Gibson

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Fluctuation microscopy examines the spatial variations in coherent microdiffraction from an ensemble of small volumes in noncrystalline systems. The variance of scattered intensity into regions of reciprocal space can be used to give insight into three-body and four-body correlation functions, which are sensitive to medium-range order. The technique was originally developed for transmission electron microscopy and was successfully used to understand medium-range order in amorphous silicon and germanium. Applying this method to X-rays, we have developed a new approach: fluctuation X-ray microscopy (FXM). The approach offers quantitative insight into medium-range correlations in materials at nanometer and larger length scales. The FXM technique can be used to explore medium-range order and subtle structural changes in a wide range of disordered materials from soft matter to nanocomposites, nanowire and quantum dot arrays. We have demonstrated this new technique by studying films of polystyrene latex spheres.

Original languageEnglish (US)
Pages (from-to)196-199
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume238
Issue number1-4
DOIs
StatePublished - Aug 2005

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Microscopic examination
microscopy
X rays
Germanium
Amorphous silicon
Latexes
Semiconductor quantum dots
Nanowires
x rays
Polystyrenes
Nanocomposites
latex
Transmission electron microscopy
amorphous silicon
germanium
polystyrene
nanocomposites
nanowires
quantum dots
transmission electron microscopy

Keywords

  • Fluctuation X-ray microscopy
  • Medium-range order
  • Nanoscale materials and nanostructures
  • Speckle

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Fluctuation microscopy - A tool for examining medium-range order in noncrystalline systems. / Fan, L.; McNulty, I.; Paterson, D.; Treacy, Michael; Gibson, J. M.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 238, No. 1-4, 08.2005, p. 196-199.

Research output: Contribution to journalArticle

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