TY - JOUR
T1 - Fluctuation microscopy - A tool for examining medium-range order in noncrystalline systems
AU - Fan, L.
AU - McNulty, I.
AU - Paterson, D.
AU - Treacy, Michael
AU - Gibson, J. M.
N1 - Funding Information:
Use of the Advanced Photon Source was supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. W-31-109-Eng-38.
PY - 2005/8
Y1 - 2005/8
N2 - Fluctuation microscopy examines the spatial variations in coherent microdiffraction from an ensemble of small volumes in noncrystalline systems. The variance of scattered intensity into regions of reciprocal space can be used to give insight into three-body and four-body correlation functions, which are sensitive to medium-range order. The technique was originally developed for transmission electron microscopy and was successfully used to understand medium-range order in amorphous silicon and germanium. Applying this method to X-rays, we have developed a new approach: fluctuation X-ray microscopy (FXM). The approach offers quantitative insight into medium-range correlations in materials at nanometer and larger length scales. The FXM technique can be used to explore medium-range order and subtle structural changes in a wide range of disordered materials from soft matter to nanocomposites, nanowire and quantum dot arrays. We have demonstrated this new technique by studying films of polystyrene latex spheres.
AB - Fluctuation microscopy examines the spatial variations in coherent microdiffraction from an ensemble of small volumes in noncrystalline systems. The variance of scattered intensity into regions of reciprocal space can be used to give insight into three-body and four-body correlation functions, which are sensitive to medium-range order. The technique was originally developed for transmission electron microscopy and was successfully used to understand medium-range order in amorphous silicon and germanium. Applying this method to X-rays, we have developed a new approach: fluctuation X-ray microscopy (FXM). The approach offers quantitative insight into medium-range correlations in materials at nanometer and larger length scales. The FXM technique can be used to explore medium-range order and subtle structural changes in a wide range of disordered materials from soft matter to nanocomposites, nanowire and quantum dot arrays. We have demonstrated this new technique by studying films of polystyrene latex spheres.
KW - Fluctuation X-ray microscopy
KW - Medium-range order
KW - Nanoscale materials and nanostructures
KW - Speckle
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U2 - 10.1016/j.nimb.2005.06.048
DO - 10.1016/j.nimb.2005.06.048
M3 - Conference article
AN - SCOPUS:25144437489
SN - 0168-583X
VL - 238
SP - 196
EP - 199
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
IS - 1-4
T2 - Synchrotron Radiation in Materials Science Proceedings of the 4th Conference on Synchrotron Radiation in Materials Science
Y2 - 23 August 2004 through 25 August 2004
ER -