Fluctuation microscopy: A probe of atomic correlations in disordered materials

P. M. Voyles, J. M. Gibson, M. M.J. Treacy

Research output: Contribution to journalArticle

84 Scopus citations

Abstract

Fluctuation microscopy is a new technique to study medium-range structure in disordered materials. Low-resolution dark-field transmission electron microscope images are interpreted as spatially resolved diffraction maps. Statistical analysis of intensity variations in these maps provides information about higher-order atom position correlation functions. Here we give a qualitative description of the technique and explore the properties and utility of higher-order correlation functions in describing the structure of disordered materials.

Original languageEnglish (US)
Pages (from-to)259-266
Number of pages8
JournalJournal of Electron Microscopy
Volume49
Issue number2
DOIs
StatePublished - Jan 1 2000
Externally publishedYes

Keywords

  • Amorphous semiconductors
  • Disordered materials
  • Fluctuation microscopy
  • Medium-range order
  • Quantitative microscopy

ASJC Scopus subject areas

  • Instrumentation

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