Flexible product code-based ECC schemes for MLC NAND Flash memories

C. Yang, Y. Emre, Chaitali Chakrabarti, T. Mudge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Error control coding (ECC) is essential for correcting soft errors in Flash memories. In such memories, as the number of erase/program cycles increases over time, the number of errors increases. In this paper we propose a flexible product code based ECC scheme that can support ECC of higher strength when needed. Specifically, we propose product codes which use Reed-Solomon (RS) codes along rows and Hamming codes along columns. When higher ECC is needed, the Hamming code along columns is replaced by two shorter Hamming codes. For instance, when the raw bit error rate increases from 2.2*10 -3 to 4.0*10 -3, the proposed ECC scheme migrates from RS(127, 121) along rows and Hamming(72,64) along columns to RS(127, 121) along rows and two Hamming(39, 32) along columns to achieve the same BER of 10 -6. While the resulting implementation has 12% higher decoding latency, it increases the lifetime of the device significantly.

Original languageEnglish (US)
Title of host publication2011 IEEE Workshop on Signal Processing Systems, SiPS 2011, Proceedings
Pages255-260
Number of pages6
DOIs
StatePublished - Dec 26 2011
Event2011 IEEE Workshop on Signal Processing Systems, SiPS 2011 - Beirut, Lebanon
Duration: Oct 4 2011Oct 7 2011

Publication series

Name2011 IEEE Workshop on Signal Processing Systems, SiPS 2011, Proceedings

Other

Other2011 IEEE Workshop on Signal Processing Systems, SiPS 2011
CountryLebanon
CityBeirut
Period10/4/1110/7/11

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Keywords

  • Flash memories
  • error correction codes
  • multi-level cell
  • product codes

ASJC Scopus subject areas

  • Signal Processing

Cite this

Yang, C., Emre, Y., Chakrabarti, C., & Mudge, T. (2011). Flexible product code-based ECC schemes for MLC NAND Flash memories. In 2011 IEEE Workshop on Signal Processing Systems, SiPS 2011, Proceedings (pp. 255-260). [6088985] (2011 IEEE Workshop on Signal Processing Systems, SiPS 2011, Proceedings). https://doi.org/10.1109/SiPS.2011.6088985