TY - GEN
T1 - Flexible digital x-ray technology for far-forward remote diagnostic and conformal x-ray imaging applications
AU - Smith, Joseph
AU - Marrs, Michael
AU - Strnad, Mark
AU - Apte, Raj B.
AU - Bert, Julie
AU - Allee, David
AU - Colaneri, Nicholas
AU - Forsythe, Eric
AU - Morton, David
PY - 2013
Y1 - 2013
N2 - Today's flat panel digital x-ray image sensors, which have been in production since the mid-1990s, are produced exclusively on glass substrates. While acceptable for use in a hospital or doctor's office, conventional glass substrate digital x-ray sensors are too fragile for use outside these controlled environments without extensive reinforcement. Reinforcement, however, significantly increases weight, bulk, and cost, making them impractical for far-forward remote diagnostic applications, which demand rugged and lightweight x-ray detectors. Additionally, glass substrate x-ray detectors are inherently rigid. This limits their use in curved or bendable, conformal x-ray imaging applications such as the non-destructive testing (NDT) of oil pipelines. However, by extending low-temperature thin-film transistor (TFT) technology previously demonstrated on plasticsubstrate- based electrophoretic and organic light emitting diode (OLED) flexible displays, it is now possible to manufacture durable, lightweight, as well as flexible digital x-ray detectors. In this paper, we discuss the principal technical approaches used to apply flexible display technology to two new large-area flexible digital x-ray sensors for defense, security, and industrial applications and demonstrate their imaging capabilities. Our results include a 4.8″ diagonal, 353×463 resolution, flexible digital x-ray detector, fabricated on a 6″ polyethylene naphthalate (PEN) plastic substrate; and a larger, 7.9″ diagonal, 720×640 resolution, flexible digital x-ray detector also fabricated on PEN and manufactured on a gen 2 (370×470 mm) substrate.
AB - Today's flat panel digital x-ray image sensors, which have been in production since the mid-1990s, are produced exclusively on glass substrates. While acceptable for use in a hospital or doctor's office, conventional glass substrate digital x-ray sensors are too fragile for use outside these controlled environments without extensive reinforcement. Reinforcement, however, significantly increases weight, bulk, and cost, making them impractical for far-forward remote diagnostic applications, which demand rugged and lightweight x-ray detectors. Additionally, glass substrate x-ray detectors are inherently rigid. This limits their use in curved or bendable, conformal x-ray imaging applications such as the non-destructive testing (NDT) of oil pipelines. However, by extending low-temperature thin-film transistor (TFT) technology previously demonstrated on plasticsubstrate- based electrophoretic and organic light emitting diode (OLED) flexible displays, it is now possible to manufacture durable, lightweight, as well as flexible digital x-ray detectors. In this paper, we discuss the principal technical approaches used to apply flexible display technology to two new large-area flexible digital x-ray sensors for defense, security, and industrial applications and demonstrate their imaging capabilities. Our results include a 4.8″ diagonal, 353×463 resolution, flexible digital x-ray detector, fabricated on a 6″ polyethylene naphthalate (PEN) plastic substrate; and a larger, 7.9″ diagonal, 720×640 resolution, flexible digital x-ray detector also fabricated on PEN and manufactured on a gen 2 (370×470 mm) substrate.
KW - A-Si
KW - Active matrix array
KW - Flexible electronics
KW - PiN photodiode
KW - TFT
KW - X-ray detector
UR - http://www.scopus.com/inward/record.url?scp=84881148207&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881148207&partnerID=8YFLogxK
U2 - 10.1117/12.2016102
DO - 10.1117/12.2016102
M3 - Conference contribution
AN - SCOPUS:84881148207
SN - 9780819495167
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Flexible Electronics
T2 - Flexible Electronics
Y2 - 1 May 2013 through 2 May 2013
ER -