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Fixture for In situ Electromigration Testing during X-ray Microtomography
Nikhilesh Chawla (Inventor)
Arizona State University
Research output
:
Patent
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Dive into the research topics of 'Fixture for In situ Electromigration Testing during X-ray Microtomography'. Together they form a unique fingerprint.
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Engineering & Materials Science
Electromigration
100%
X rays
70%
Testing
40%
Soldering alloys
15%
Aspect ratio
14%
Scanning
11%
Synchrotrons
10%
Electron microscopy
10%
Electronics packaging
9%
Soldering
9%
Networks (circuits)
8%
Microelectronics
8%
Atoms
8%
Electrons
7%
Cathodes
7%
Short circuit currents
7%
Anodes
7%
Tomography
7%
Microscopes
7%
Electron microscopes
7%
Semiconductor materials
6%
Numerical models
6%
Temperature
6%
Detectors
6%
Microstructure
5%