Abstract
We have constructed atomistic models of a-Si:H surfaces which differ in their bulk H concentration. The models are constructed by cleaving bulk a-Si:H structures and passivating the new surfaces with H. We analyse the geometric and electronic structure of each surface and compare them. These models will be useful for future studies of chemical reactions on the surface.
Original language | English (US) |
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Pages (from-to) | 549-562 |
Number of pages | 14 |
Journal | Modelling and Simulation in Materials Science and Engineering |
Volume | 5 |
Issue number | 6 |
DOIs | |
State | Published - Nov 1997 |
ASJC Scopus subject areas
- Modeling and Simulation
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Computer Science Applications