Field penetration and its contribution to field enhanced thermionic electron emission from nanocrystalline diamond films

F. A.M. Koeck, R. J. Nemanich

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

Field emission from sulfur doped nanocrystalline diamond films is characterized by intense emission sites with nm scale diameters. Field emission measurements were obtained at room temperature and analyzed in terms of the Fowler-Nordheim expression where electron emission is due to tunneling through a diminished barrier. The electron emission versus temperature was also recorded at a series of applied fields from 0.5 to 0.8 V/μm. These results were analyzed in terms of a modified Richardson-Dushman relation which describes field dependent thermionic emission. It was found that both sets of data could be fit with a work function of 2.0 eV and a field enhancement factor of ∼ 1750. The large field enhancement could not be correlated with specific structures on the relatively flat surfaces. The field and thermionic-field emission from the sulfur doped nanocrystalline diamond films is evaluated by a model which includes barrier lowering as a result of field penetration effects.

Original languageEnglish (US)
Pages (from-to)2006-2009
Number of pages4
JournalDiamond and Related Materials
Volume15
Issue number11-12 SPEC. ISS.
DOIs
StatePublished - Nov 1 2006
Externally publishedYes

Keywords

  • CVD
  • Field emission
  • Nanocrystalline diamond
  • Thermionic emission

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Materials Chemistry
  • Electrical and Electronic Engineering

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