Field inspection of PV modules: Quantitative determination of performance loss due to cell cracks using el images

Carlos A. Rodríguez Castañeda, Shashwata Chattopadhyay, Jaewon Oh, Sai Tatapudi, Govindasamy TamizhMani, Hailin Hu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Electroluminescence (EL) imaging has been used by the operation and maintenance companies for a qualitative detection of cells cracks in the fielded photovoltaic (PV) modules. This paper presents our attempts to statistically determine the inactive area of the cells in a PV module using processed EL images and to quantitatively correlate the remaining active area with the performance data including quantum efficiency (QE) and short-circuit current (ISC). Commercially available image processing tools have been used to extract the statistics of the defective (inactive) areas of the cells in a module. The power parameter against EL-determined active area can have linear, independent or non-linear correlation depending on whether the cells are having microcracks, part cell isolation or shunting which affect VOC, ISC and FF linearly or non-linearly.

Original languageEnglish (US)
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1858-1862
Number of pages5
ISBN (Electronic)9781509056057
DOIs
StatePublished - 2017
Externally publishedYes
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: Jun 25 2017Jun 30 2017

Publication series

Name2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
Volume2017-June

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period6/25/176/30/17

Keywords

  • Electroluminescence
  • Photovoltaic cells
  • Short-circuit currents
  • Silicon

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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