TY - GEN
T1 - Field inspection of PV modules
T2 - 44th IEEE Photovoltaic Specialist Conference, PVSC 2017
AU - Rodríguez Castañeda, Carlos A.
AU - Chattopadhyay, Shashwata
AU - Oh, Jaewon
AU - Tatapudi, Sai
AU - TamizhMani, Govindasamy
AU - Hu, Hailin
N1 - Funding Information:
This research is based upon work supported by the Solar Energy Research Institute for India and the U.S. (SERIIUS) funded jointly by the U.S. Department of Energy subcontract DE AC36-08G028308 (Office of Science, Office of Basic Energy Sciences, and Energy Efficiency and Renewable Energy, Solar Energy Technology Program, with support from the Office of International Affairs) and the Government of India subcontract IUSSTF/JCERDC-SERIIUS/2012 dated 22nd Nov. 2012.
Publisher Copyright:
© 2017 IEEE.
PY - 2017
Y1 - 2017
N2 - Electroluminescence (EL) imaging has been used by the operation and maintenance companies for a qualitative detection of cells cracks in the fielded photovoltaic (PV) modules. This paper presents our attempts to statistically determine the inactive area of the cells in a PV module using processed EL images and to quantitatively correlate the remaining active area with the performance data including quantum efficiency (QE) and short-circuit current (ISC). Commercially available image processing tools have been used to extract the statistics of the defective (inactive) areas of the cells in a module. The power parameter against EL-determined active area can have linear, independent or non-linear correlation depending on whether the cells are having microcracks, part cell isolation or shunting which affect VOC, ISC and FF linearly or non-linearly.
AB - Electroluminescence (EL) imaging has been used by the operation and maintenance companies for a qualitative detection of cells cracks in the fielded photovoltaic (PV) modules. This paper presents our attempts to statistically determine the inactive area of the cells in a PV module using processed EL images and to quantitatively correlate the remaining active area with the performance data including quantum efficiency (QE) and short-circuit current (ISC). Commercially available image processing tools have been used to extract the statistics of the defective (inactive) areas of the cells in a module. The power parameter against EL-determined active area can have linear, independent or non-linear correlation depending on whether the cells are having microcracks, part cell isolation or shunting which affect VOC, ISC and FF linearly or non-linearly.
KW - Electroluminescence
KW - Photovoltaic cells
KW - Short-circuit currents
KW - Silicon
UR - http://www.scopus.com/inward/record.url?scp=85090615087&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85090615087&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2017.8366560
DO - 10.1109/PVSC.2017.8366560
M3 - Conference contribution
AN - SCOPUS:85090615087
T3 - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
SP - 1858
EP - 1862
BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 June 2017 through 30 June 2017
ER -