Fault coverage and test length estimation for random pattern testing

Amitava Majumdar, Sarma Vrudhula

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

Fault coverage and test length estimation in circuits under random test is the subject of this paper. Testing by a sequence of random input patterns is newed as sequential sampling of faults from a given fault universe. Based on this model, the probability mass function (pmf) of fault coverage and expressions for all its moments are derived. This provides a means for computing estimates of fault coverage as well as determining the accuracy of the estimates. Test length, newed as waiting time on fault coverage, is analyzed next. We derive expressions for its pmf and its prob- ability generating function (pgf). This allows computation of all the higher order moments. In particular, expressions for mean and variance of test length for any specified fault coverage are derived. This is a considerable enhancement of the state of the art in techniques for predicting test length as a function of fault coverage. It is shown that any moment of test length requires knowledge of all the moments of fault coverage, and hence, its pmf. For this reason, expressions for approximating its expected value and variance, for user specified error bounds, are also given. A methodology based on these results is outlined. Experiments carried out on several circuits demonstrate that this technique is capable of providing excellent predictions of test length. Furthermore it is shown, as with fault coverage prediction, that estimates of variances can be used to bound average test length quite effectively.

Original languageEnglish (US)
Pages (from-to)234-247
Number of pages14
JournalIEEE Transactions on Computers
Volume44
Issue number2
DOIs
StatePublished - Feb 1995

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Coverage
Fault
Testing
Networks (circuits)
Moment
Sampling
Estimate
Sequential Sampling
Higher Order Moments
Prediction
Expected Value
Waiting Time
Experiments
Error Bounds
Generating Function
Enhancement
Methodology
Computing
Demonstrate
Experiment

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture

Cite this

Fault coverage and test length estimation for random pattern testing. / Majumdar, Amitava; Vrudhula, Sarma.

In: IEEE Transactions on Computers, Vol. 44, No. 2, 02.1995, p. 234-247.

Research output: Contribution to journalArticle

@article{22bdc64576ff4635a20912c14e3aa7db,
title = "Fault coverage and test length estimation for random pattern testing",
abstract = "Fault coverage and test length estimation in circuits under random test is the subject of this paper. Testing by a sequence of random input patterns is newed as sequential sampling of faults from a given fault universe. Based on this model, the probability mass function (pmf) of fault coverage and expressions for all its moments are derived. This provides a means for computing estimates of fault coverage as well as determining the accuracy of the estimates. Test length, newed as waiting time on fault coverage, is analyzed next. We derive expressions for its pmf and its prob- ability generating function (pgf). This allows computation of all the higher order moments. In particular, expressions for mean and variance of test length for any specified fault coverage are derived. This is a considerable enhancement of the state of the art in techniques for predicting test length as a function of fault coverage. It is shown that any moment of test length requires knowledge of all the moments of fault coverage, and hence, its pmf. For this reason, expressions for approximating its expected value and variance, for user specified error bounds, are also given. A methodology based on these results is outlined. Experiments carried out on several circuits demonstrate that this technique is capable of providing excellent predictions of test length. Furthermore it is shown, as with fault coverage prediction, that estimates of variances can be used to bound average test length quite effectively.",
author = "Amitava Majumdar and Sarma Vrudhula",
year = "1995",
month = "2",
doi = "10.1109/12.364535",
language = "English (US)",
volume = "44",
pages = "234--247",
journal = "IEEE Transactions on Computers",
issn = "0018-9340",
publisher = "IEEE Computer Society",
number = "2",

}

TY - JOUR

T1 - Fault coverage and test length estimation for random pattern testing

AU - Majumdar, Amitava

AU - Vrudhula, Sarma

PY - 1995/2

Y1 - 1995/2

N2 - Fault coverage and test length estimation in circuits under random test is the subject of this paper. Testing by a sequence of random input patterns is newed as sequential sampling of faults from a given fault universe. Based on this model, the probability mass function (pmf) of fault coverage and expressions for all its moments are derived. This provides a means for computing estimates of fault coverage as well as determining the accuracy of the estimates. Test length, newed as waiting time on fault coverage, is analyzed next. We derive expressions for its pmf and its prob- ability generating function (pgf). This allows computation of all the higher order moments. In particular, expressions for mean and variance of test length for any specified fault coverage are derived. This is a considerable enhancement of the state of the art in techniques for predicting test length as a function of fault coverage. It is shown that any moment of test length requires knowledge of all the moments of fault coverage, and hence, its pmf. For this reason, expressions for approximating its expected value and variance, for user specified error bounds, are also given. A methodology based on these results is outlined. Experiments carried out on several circuits demonstrate that this technique is capable of providing excellent predictions of test length. Furthermore it is shown, as with fault coverage prediction, that estimates of variances can be used to bound average test length quite effectively.

AB - Fault coverage and test length estimation in circuits under random test is the subject of this paper. Testing by a sequence of random input patterns is newed as sequential sampling of faults from a given fault universe. Based on this model, the probability mass function (pmf) of fault coverage and expressions for all its moments are derived. This provides a means for computing estimates of fault coverage as well as determining the accuracy of the estimates. Test length, newed as waiting time on fault coverage, is analyzed next. We derive expressions for its pmf and its prob- ability generating function (pgf). This allows computation of all the higher order moments. In particular, expressions for mean and variance of test length for any specified fault coverage are derived. This is a considerable enhancement of the state of the art in techniques for predicting test length as a function of fault coverage. It is shown that any moment of test length requires knowledge of all the moments of fault coverage, and hence, its pmf. For this reason, expressions for approximating its expected value and variance, for user specified error bounds, are also given. A methodology based on these results is outlined. Experiments carried out on several circuits demonstrate that this technique is capable of providing excellent predictions of test length. Furthermore it is shown, as with fault coverage prediction, that estimates of variances can be used to bound average test length quite effectively.

UR - http://www.scopus.com/inward/record.url?scp=0029254427&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029254427&partnerID=8YFLogxK

U2 - 10.1109/12.364535

DO - 10.1109/12.364535

M3 - Article

AN - SCOPUS:0029254427

VL - 44

SP - 234

EP - 247

JO - IEEE Transactions on Computers

JF - IEEE Transactions on Computers

SN - 0018-9340

IS - 2

ER -