Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading

Subhasish Mohanty, Aditi Chattopadhyay, Pedro Peralta, Dan Quech

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The accurate estimation of fatigue life of metallic structural components in service environments is still a challenge for the aircraft designer or fleet manager. Majority of the current available fatigue life prediction models has deficiency to accurately predict damage under random or flight profile service loads. The inherent accuracy is due to the stochastic nature of crack propagation in metallic structure. In addition, currently no generic prediction model available accounting the load interaction effects due to variable loading. In the present paper we discus the use of a Generic Bayesian framework based Gaussian process approach to probabilistically predict the fatigue damage under complex random and flight profile loading.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7649
DOIs
StatePublished - 2010
EventNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010 - San Diego, CA, United States
Duration: Mar 8 2010Mar 11 2010

Other

OtherNondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010
CountryUnited States
CitySan Diego, CA
Period3/8/103/11/10

Fingerprint

Fatigue Damage
prognosis
fatigue life
Biaxial
Prognosis
Fatigue damage
Prediction Model
flight
Fatigue of materials
damage
Fatigue Life Prediction
Predict
Interaction Effects
Fatigue Life
Crack Propagation
crack propagation
profiles
predictions
Gaussian Process
aircraft

Keywords

  • Bayesian modeling
  • Biaxial loading
  • FALSTAFF flight profile loading
  • Gaussian process
  • Multi variate fatigue modeling
  • Random loading

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Mohanty, S., Chattopadhyay, A., Peralta, P., & Quech, D. (2010). Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7649). [76490C] https://doi.org/10.1117/12.848814

Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading. / Mohanty, Subhasish; Chattopadhyay, Aditi; Peralta, Pedro; Quech, Dan.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7649 2010. 76490C.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mohanty, S, Chattopadhyay, A, Peralta, P & Quech, D 2010, Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7649, 76490C, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010, San Diego, CA, United States, 3/8/10. https://doi.org/10.1117/12.848814
Mohanty S, Chattopadhyay A, Peralta P, Quech D. Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7649. 2010. 76490C https://doi.org/10.1117/12.848814
Mohanty, Subhasish ; Chattopadhyay, Aditi ; Peralta, Pedro ; Quech, Dan. / Fatigue damage prognosis of a cruciform structure under biaxial random and flight profile loading. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7649 2010.
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