Fatigue crack detection and localization using reference-free method

Sunilkumar Soni, Seung Bum Kim, Aditi Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This work focuses on fatigue crack detection, crack tip localization and quantification in plate like structures using a reference-free method. In many practical applications the environmental conditions in which a structure is operated do not remain same over time. Sensor signals, thus, collected for the damaged state cannot be compared directly with the baseline because a change in the signal can be caused by several factors other than a structural damage. Therefore, reference-free methods are needed for damage detection. Two methods have been discussed in this paper, one with collocated sensors and the other using matching pursuit decomposition (MPD) to detect waves undergoing mode conversion from fatigue crack tip. The time of flight (TOF) of these mode converted waves along with their respective velocities are further used to localize the crack tip and ultimately find the extent of crack. Both these approaches were used to detect fatigue cracks in aluminum plates made of 6061 alloy. These samples were instrumented with collocated piezoelectric sensors and tested under constant amplitude fatigue loading. Crack tip localization was done from the TOF information extracted for mode converted waves using MPD. The crack lengths obtained using this reference-free technique were validated with experimental crack lengths and were found to be in good agreement.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7648
DOIs
StatePublished - 2010
EventSmart Sensor Phenomena, Technology, Networks, and Systems 2010 - San Diego, CA, United States
Duration: Mar 8 2010Mar 10 2010

Other

OtherSmart Sensor Phenomena, Technology, Networks, and Systems 2010
CountryUnited States
CitySan Diego, CA
Period3/8/103/10/10

Fingerprint

Crack Detection
Crack detection
Fatigue Crack
Crack Tip
Crack tips
crack tips
cracks
Matching Pursuit
Crack
Time-of-flight
Cracks
Sensors
Piezoelectric Sensor
sensors
Decomposition
Decompose
Sensor
Damage Detection
Damage detection
damage

Keywords

  • Collocated sensors
  • Fatigue damage
  • Lamb waves
  • Lug joints
  • Matching pursuit decomposition
  • Mode conversion
  • Piezoelectric sensors
  • Reference-free damage detection

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Soni, S., Kim, S. B., & Chattopadhyay, A. (2010). Fatigue crack detection and localization using reference-free method. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7648). [76480U] https://doi.org/10.1117/12.847891

Fatigue crack detection and localization using reference-free method. / Soni, Sunilkumar; Kim, Seung Bum; Chattopadhyay, Aditi.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7648 2010. 76480U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Soni, S, Kim, SB & Chattopadhyay, A 2010, Fatigue crack detection and localization using reference-free method. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7648, 76480U, Smart Sensor Phenomena, Technology, Networks, and Systems 2010, San Diego, CA, United States, 3/8/10. https://doi.org/10.1117/12.847891
Soni S, Kim SB, Chattopadhyay A. Fatigue crack detection and localization using reference-free method. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7648. 2010. 76480U https://doi.org/10.1117/12.847891
Soni, Sunilkumar ; Kim, Seung Bum ; Chattopadhyay, Aditi. / Fatigue crack detection and localization using reference-free method. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7648 2010.
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