Fast and accurate computation of dielectric losses in multi-layer, multi-conductor microstrip structures

James P K Gilb, Constantine Balanis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

An approach is proposed which can be used in lieu of lossy, full-wave solutions to provide accurate and efficient data for the CAD (computer-aided design) of multilayer, multiconductor MIC and MMIC (monolithic microwave integrated circuits) structures. This application gives results that are as accurate as those lossy full-wave techniques over a wide range of frequency, including the dispersive region. In addition to giving accurate results, this method is up to three times faster, depending on the number and type of substrates or superstrates. Results are shown for various symmetric and asymmetric, multiconductor, multilayer structures which have good agreement with the lossy, full-wave approach and use significantly less computer time.

Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherPubl by IEEE
Pages385-388
Number of pages4
Volume1
StatePublished - Jun 1992
Event1992 IEEE MTT-S International Microwave Symposium Digest Part 2 (of 3) - Albuquerque, NM, USA
Duration: Jun 1 1992Jun 5 1992

Other

Other1992 IEEE MTT-S International Microwave Symposium Digest Part 2 (of 3)
CityAlbuquerque, NM, USA
Period6/1/926/5/92

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Fast and accurate computation of dielectric losses in multi-layer, multi-conductor microstrip structures'. Together they form a unique fingerprint.

Cite this