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Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects
J. L. Taggart, R. B. Jacobs-Gedrim, M. L. McLain, Hugh Barnaby, E. S. Bielejec, W. Hardy, M. J. Marinella, Michael Kozicki, Keith Holbert
- Applied Nanoionics, Center for (CANi)
- Embedded Systems, Consortium for (CES)
- Solid State Electronics Research Center (CSSER)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Electrical Engineering
- Connection One (C1)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Materials Science and Engineering
- Nano-Electronics, Arizona Institute of (AINE)
- Knowledge Enterprise (KE)
Research output: Contribution to journal › Article › peer-review
2
Scopus
citations