Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011

G. Tamizhmani; B. Li; T. Arends; W. Shisler; A. Voropayev; D. Parker; K. Kroner; J. Armstrong

doi:10.1109/PVSC.2012.6318086

Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011

G. Tamizhmani, B. Li, T. Arends, W. Shisler, A. Voropayev, D. Parker, K. Kroner, J. Armstrong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).

Original language	English (US)
Title of host publication	Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages	2426-2431
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2012.6318086
State	Published - Nov 26 2012
Externally published	Yes
Event	38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: Jun 3 2012 → Jun 8 2012

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country	United States
City	Austin, TX
Period	6/3/12 → 6/8/12

Keywords

accelerated testing
failure rate
qualification testing
reliability testing

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2012.6318086

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Tamizhmani, G., Li, B., Arends, T., Shisler, W., Voropayev, A., Parker, D., Kroner, K., & Armstrong, J. (2012). Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 2426-2431). [6318086] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6318086

Failure rate analysis of module design qualification testing - IV : 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. / Tamizhmani, G.; Li, B.; Arends, T.; Shisler, W.; Voropayev, A.; Parker, D.; Kroner, K.; Armstrong, J.

Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 2426-2431 6318086 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tamizhmani, G, Li, B, Arends, T, Shisler, W, Voropayev, A, Parker, D, Kroner, K & Armstrong, J 2012, Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. in Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012., 6318086, Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2426-2431, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, United States, 6/3/12. https://doi.org/10.1109/PVSC.2012.6318086

Tamizhmani G, Li B, Arends T, Shisler W, Voropayev A, Parker D et al. Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 2426-2431. 6318086. (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6318086

Tamizhmani, G. ; Li, B. ; Arends, T. ; Shisler, W. ; Voropayev, A. ; Parker, D. ; Kroner, K. ; Armstrong, J. / Failure rate analysis of module design qualification testing - IV : 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. pp. 2426-2431 (Conference Record of the IEEE Photovoltaic Specialists Conference).

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