TY - GEN
T1 - Failure rate analysis of module design qualification testing - IV
T2 - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
AU - Tamizhmani, G.
AU - Li, B.
AU - Arends, T.
AU - Shisler, W.
AU - Voropayev, A.
AU - Parker, D.
AU - Kroner, K.
AU - Armstrong, J.
PY - 2012
Y1 - 2012
N2 - Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).
AB - Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).
KW - accelerated testing
KW - failure rate
KW - qualification testing
KW - reliability testing
UR - http://www.scopus.com/inward/record.url?scp=84869467189&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84869467189&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2012.6318086
DO - 10.1109/PVSC.2012.6318086
M3 - Conference contribution
AN - SCOPUS:84869467189
SN - 9781467300643
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 2426
EP - 2431
BT - Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Y2 - 3 June 2012 through 8 June 2012
ER -
