Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011

G. Tamizhmani, B. Li, T. Arends, W. Shisler, A. Voropayev, D. Parker, K. Kroner, J. Armstrong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).

Original languageEnglish (US)
Title of host publicationProgram - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages2426-2431
Number of pages6
DOIs
StatePublished - Nov 26 2012
Externally publishedYes
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: Jun 3 2012Jun 8 2012

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other38th IEEE Photovoltaic Specialists Conference, PVSC 2012
CountryUnited States
CityAustin, TX
Period6/3/126/8/12

Keywords

  • accelerated testing
  • failure rate
  • qualification testing
  • reliability testing

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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    Tamizhmani, G., Li, B., Arends, T., Shisler, W., Voropayev, A., Parker, D., Kroner, K., & Armstrong, J. (2012). Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 2426-2431). [6318086] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2012.6318086