Abstract
Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).
| Original language | English (US) |
|---|---|
| Title of host publication | Conference Record of the IEEE Photovoltaic Specialists Conference |
| Pages | 2426-2431 |
| Number of pages | 6 |
| DOIs | |
| State | Published - 2012 |
| Externally published | Yes |
| Event | 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: Jun 3 2012 → Jun 8 2012 |
Other
| Other | 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 |
|---|---|
| Country | United States |
| City | Austin, TX |
| Period | 6/3/12 → 6/8/12 |
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Keywords
- accelerated testing
- failure rate
- qualification testing
- reliability testing
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Control and Systems Engineering
- Industrial and Manufacturing Engineering
Cite this
Failure rate analysis of module design qualification testing - IV : 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. / Tamizhmani, Govindasamy; Li, B.; Arends, T.; Shisler, W.; Voropayev, A.; Parker, D.; Kroner, K.; Armstrong, J.
Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. p. 2426-2431 6318086.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Failure rate analysis of module design qualification testing - IV
T2 - 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011
AU - Tamizhmani, Govindasamy
AU - Li, B.
AU - Arends, T.
AU - Shisler, W.
AU - Voropayev, A.
AU - Parker, D.
AU - Kroner, K.
AU - Armstrong, J.
PY - 2012
Y1 - 2012
N2 - Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).
AB - Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).
KW - accelerated testing
KW - failure rate
KW - qualification testing
KW - reliability testing
UR - http://www.scopus.com/inward/record.url?scp=84869467189&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84869467189&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2012.6318086
DO - 10.1109/PVSC.2012.6318086
M3 - Conference contribution
AN - SCOPUS:84869467189
SN - 9781467300643
SP - 2426
EP - 2431
BT - Conference Record of the IEEE Photovoltaic Specialists Conference
ER -