Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011

Govindasamy Tamizhmani, B. Li, T. Arends, W. Shisler, A. Voropayev, D. Parker, K. Kroner, J. Armstrong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Qualification testing of photovoltaic modules, according to IEC 61215 (crystalline silicon) or IEC 61646 (thin-film) standard, may be considered as a minimum requirement for reliability or a prerequisite for any reliability testing. It is a set of well-defined accelerated stress tests with strict pass / fail criteria based on functionality / performance, safety / insulation and visual requirements. This paper, fourth in series from TUV Rheinland PTL, compares the failure rates obtained over 15 years in four consecutive periods: 1997-2005, 2005-2007, 2007-2009 and 2009-2011. This paper also presents a distribution of failures, for the 2009-2011 period, among the four pass criteria defined in the standard: visual failure, dry insulation failure (safety issue), wet resistance failure (safety issue) and performance failure (power drop).

Original languageEnglish (US)
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Pages2426-2431
Number of pages6
DOIs
StatePublished - 2012
Externally publishedYes
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: Jun 3 2012Jun 8 2012

Other

Other38th IEEE Photovoltaic Specialists Conference, PVSC 2012
CountryUnited States
CityAustin, TX
Period6/3/126/8/12

Fingerprint

Insulation
Testing
Crystalline materials
Thin films
Silicon

Keywords

  • accelerated testing
  • failure rate
  • qualification testing
  • reliability testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Tamizhmani, G., Li, B., Arends, T., Shisler, W., Voropayev, A., Parker, D., ... Armstrong, J. (2012). Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 2426-2431). [6318086] https://doi.org/10.1109/PVSC.2012.6318086

Failure rate analysis of module design qualification testing - IV : 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. / Tamizhmani, Govindasamy; Li, B.; Arends, T.; Shisler, W.; Voropayev, A.; Parker, D.; Kroner, K.; Armstrong, J.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. p. 2426-2431 6318086.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tamizhmani, G, Li, B, Arends, T, Shisler, W, Voropayev, A, Parker, D, Kroner, K & Armstrong, J 2012, Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. in Conference Record of the IEEE Photovoltaic Specialists Conference., 6318086, pp. 2426-2431, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, United States, 6/3/12. https://doi.org/10.1109/PVSC.2012.6318086
Tamizhmani G, Li B, Arends T, Shisler W, Voropayev A, Parker D et al. Failure rate analysis of module design qualification testing - IV: 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. p. 2426-2431. 6318086 https://doi.org/10.1109/PVSC.2012.6318086
Tamizhmani, Govindasamy ; Li, B. ; Arends, T. ; Shisler, W. ; Voropayev, A. ; Parker, D. ; Kroner, K. ; Armstrong, J. / Failure rate analysis of module design qualification testing - IV : 1997-2005 vs. 2005-2007 vs. 2007-2009 vs. 2009-2011. Conference Record of the IEEE Photovoltaic Specialists Conference. 2012. pp. 2426-2431
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