14 Citations (Scopus)

Abstract

An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.

Original languageEnglish (US)
Pages (from-to)3997-4000
Number of pages4
JournalChemical Communications
Volume54
Issue number32
DOIs
StatePublished - Jan 1 2018

Fingerprint

Crushing
Silicon
Anodes
Cracks
Debonding
Optical systems

ASJC Scopus subject areas

  • Catalysis
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Chemistry(all)
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution. / Yang, Le; Chen, Hao Sen; Jiang, Hanqing; Wei, Yu Jie; Song, Wei Li; Fang, Dai Ning.

In: Chemical Communications, Vol. 54, No. 32, 01.01.2018, p. 3997-4000.

Research output: Contribution to journalArticle

Yang, Le ; Chen, Hao Sen ; Jiang, Hanqing ; Wei, Yu Jie ; Song, Wei Li ; Fang, Dai Ning. / Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution. In: Chemical Communications. 2018 ; Vol. 54, No. 32. pp. 3997-4000.
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AU - Fang, Dai Ning

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