Abstract
An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.
Original language | English (US) |
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Pages (from-to) | 3997-4000 |
Number of pages | 4 |
Journal | Chemical Communications |
Volume | 54 |
Issue number | 32 |
DOIs | |
State | Published - 2018 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Metals and Alloys
- Materials Chemistry
- Surfaces, Coatings and Films
- General Chemistry
- Catalysis