16 Scopus citations


An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes.

Original languageEnglish (US)
Pages (from-to)3997-4000
Number of pages4
JournalChemical Communications
Issue number32
StatePublished - Jan 1 2018

ASJC Scopus subject areas

  • Catalysis
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Chemistry(all)
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Failure mechanisms of 2D silicon film anodes:: In situ observations and simulations on crack evolution'. Together they form a unique fingerprint.

  • Cite this