Failure diagnosis of asymmetric aging under NBTI

Jyothi Bhaskarr Velamala, Venkatesa Ravi, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

20 Citations (Scopus)

Abstract

Design for reliability is becoming an important step in the design cycle with CMOS technology scaling, demanding need for efficient and accurate reliability simulation methods in the design stage. Traditional aging analysis does not differentiate NBTI induced delay shift in rising and falling edges, thereby assuming averaging effect due to recovery. It is essential to identify the critical operation conditions that are more susceptible to timing violations under aging. In this paper, by identifying the critical moments in circuit operation and considering the asymmetric aging effects, timing violations under NBTI effect are correctly predicted. The unique features of this work include: (1) delay modeling of a digital gate due to threshold voltage (V th) shift using delay dependence on supply voltage from cell library; (2) asymmetric aging analysis is conducted by recognizing the critical points in circuit operation; and (3) setup and hold timing violations due to NBTI induced path delay shift in logic and clock buffer are investigated. This failure assessment method is further demonstrated in ISCAS89 benchmark circuits using 45nm Nangate standard cell library to extract aging information in critical paths. The proposed failure diagnosis enables resilient design techniques to mitigate circuit aging under NBTI.

Original languageEnglish (US)
Title of host publicationIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Pages428-433
Number of pages6
DOIs
StatePublished - 2011
Event2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011 - San Jose, CA, United States
Duration: Nov 7 2011Nov 10 2011

Other

Other2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
CountryUnited States
CitySan Jose, CA
Period11/7/1111/10/11

Fingerprint

Aging of materials
Networks (circuits)
Threshold voltage
Negative bias temperature instability
Clocks
Recovery
Electric potential

Keywords

  • Asymmetric Aging
  • Design for Reliability
  • Negative Bias Temperature Instability
  • Static Timing Analysis

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Software

Cite this

Velamala, J. B., Ravi, V., & Cao, Y. (2011). Failure diagnosis of asymmetric aging under NBTI. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD (pp. 428-433). [6105364] https://doi.org/10.1109/ICCAD.2011.6105364

Failure diagnosis of asymmetric aging under NBTI. / Velamala, Jyothi Bhaskarr; Ravi, Venkatesa; Cao, Yu.

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2011. p. 428-433 6105364.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Velamala, JB, Ravi, V & Cao, Y 2011, Failure diagnosis of asymmetric aging under NBTI. in IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD., 6105364, pp. 428-433, 2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011, San Jose, CA, United States, 11/7/11. https://doi.org/10.1109/ICCAD.2011.6105364
Velamala JB, Ravi V, Cao Y. Failure diagnosis of asymmetric aging under NBTI. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2011. p. 428-433. 6105364 https://doi.org/10.1109/ICCAD.2011.6105364
Velamala, Jyothi Bhaskarr ; Ravi, Venkatesa ; Cao, Yu. / Failure diagnosis of asymmetric aging under NBTI. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2011. pp. 428-433
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