Failure analysis of design qualification testing: 2007 VS. 2005

G. TamizhMani, B. Li, T. Arends, J. Kuitche, B. Raghuraman, W. Shisler, K. Farnsworth, J. Gonzales, A. Voropayev, P. Symanski

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Scopus citations

    Abstract

    The design/performance qualification testing is a set of well-defined accelerated stress tests with strict pass/fail criteria. ASU-PTL is an ISO 17025 accredited testing laboratory and has been providing photovoltaic testing services since 1992. This paper presents a failure analysis on the design qualification testing of both crystalline silicon (c-Si) and thin-film technologies for two consecutive periods: 1997-2005 2005-2007. In the first period, the industry was growing at a slower rate with traditional manufacturers and the qualification testing of c-Si technologies was primarily conducted per Edition 1 of IEC 61215 standard. In the second period, the industry was growing at an explosive rate with new manufacturers joining the traditional manufacturers and the qualification testing of c-Si was primarily conducted per Edition 2 of IEC 61215. Similar failure analysis according to IEC 61646 has been carried out for the thin-film technologies as well. The failure analysis of the test results presented in this paper indicates a large increase in the failure rates for both c-Si and thin-film technologies during the period of 2005-2007.

    Original languageEnglish (US)
    Title of host publication33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
    DOIs
    StatePublished - Dec 1 2008
    Event33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 - San Diego, CA, United States
    Duration: May 11 2008May 16 2008

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Other

    Other33rd IEEE Photovoltaic Specialists Conference, PVSC 2008
    CountryUnited States
    CitySan Diego, CA
    Period5/11/085/16/08

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering

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  • Cite this

    TamizhMani, G., Li, B., Arends, T., Kuitche, J., Raghuraman, B., Shisler, W., Farnsworth, K., Gonzales, J., Voropayev, A., & Symanski, P. (2008). Failure analysis of design qualification testing: 2007 VS. 2005. In 33rd IEEE Photovoltaic Specialists Conference, PVSC 2008 [4922768] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2008.4922768