Extraction of EVM from transmitter system parameters

Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Scopus citations

Abstract

Error Vector Magnitude (EVM) is a system-level parameter that is specified for most advanced communication standards. EVM measurement often takes extensive test development efforts, tester resources, and long test times. Since EVM is analytically related to system impairments, which are typically measured in a production test environment, it can be eliminated from the test list if the relations between EVM and system impairments are derived in a manner that is independent of the circuit implementation and manufacturing process. In this paper, we focus on the WLAN standard, and derive the relations between EVM and three of the most detrimental impairments for QAM/OFDM based systems: IQ imbalance, non-linearity, and noise. Simulations and hardware experiments show that the accuracy of the analytical models is in par with a direct EVM measurement with a reasonable test time.

Original languageEnglish (US)
Title of host publicationProceedings - 16th IEEE European Test Symposium, ETS 2011
Pages75-80
Number of pages6
DOIs
StatePublished - Aug 29 2011
Event16th IEEE European Test Symposium, ETS 2011 - Trondheim, Norway
Duration: May 23 2011May 27 2011

Publication series

NameProceedings - 16th IEEE European Test Symposium, ETS 2011

Other

Other16th IEEE European Test Symposium, ETS 2011
CountryNorway
CityTrondheim
Period5/23/115/27/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Nassery, A., Ozev, S., Verhelst, M., & Slamani, M. (2011). Extraction of EVM from transmitter system parameters. In Proceedings - 16th IEEE European Test Symposium, ETS 2011 (pp. 75-80). [5957926] (Proceedings - 16th IEEE European Test Symposium, ETS 2011). https://doi.org/10.1109/ETS.2011.46