Extended Accelerated Stress Testing (EAST) of Glass/Glass, Glass/Backsheet and Glass/Transparent Backsheet PV Modules: Influence of EVA and POE Encapsulants

Akash Kumar, Ashwini Pavgi, Peter Hacke, Kaushik Roy Choudhury, Govinda Samy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the indoor extended accelerated stress testing (EAST) results of glass/glass (GG), glass/backsheet (GB) and glass/transparent backsheet (GT) modules having identical cells and two different encapsulant types, ethyl-vinyl-acetate (EVA) and polyolefin-elastomer (POE). Six 4-cell modules having the abovementioned construction combinations were subjected to extended ultraviolet (UV; 600 kWh/m2), damp-heat (DH; 2000 hours) and thermal-cycling (TC; 600 cycles) tests. The post-stress UV fluorescent imaging, electroluminescent imaging, reflectance spectrophotometry and colorimetry results indicated that the grid finger degradation and encapsulant browning are slightly higher in the GG modules compared to the GB modules. The post-stress IV test results indicated, in general, that the GG/EVA modules tend to perform inferior to the GG/POE modules with the EAST evaluation.

Original languageEnglish (US)
Title of host publication2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1065-1067
Number of pages3
ISBN (Electronic)9781728161174
DOIs
StatePublished - 2022
Event49th IEEE Photovoltaics Specialists Conference, PVSC 2022 - Philadelphia, United States
Duration: Jun 5 2022Jun 10 2022

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2022-June
ISSN (Print)0160-8371

Conference

Conference49th IEEE Photovoltaics Specialists Conference, PVSC 2022
Country/TerritoryUnited States
CityPhiladelphia
Period6/5/226/10/22

Keywords

  • EVA
  • POE
  • glass/backsheet
  • glass/glass
  • indoor accelerated stress testing
  • reliability

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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