Experimentally measured input referred voltage offsets and kickback noise in RHBD analog comparator arrays

Nathan D. Hindman, Ziyan Wang, Lawrence T. Clark, David Allee

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Analog comparator arrays fabricated on a bulk CMOS 130-nm are measured to quantify input-referred offsets due to transistor variation and kickback noise. Comparators using RHBD edgeless and conventional two-edge transistors are compared to determine the impact on the circuit behavior. Both random variation and kickback noise are slightly larger than for an equivalent design using two-edge transistors. The input-referred offsets are shown to be completely systematic.

Original languageEnglish (US)
Pages (from-to)2073-2079
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume54
Issue number6
DOIs
StatePublished - Dec 1 2007

Keywords

  • Analog comparator offset
  • Analog-to-digital converters
  • Integrated circuit radiation effects
  • Kickback noise
  • Radiation hardening

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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