Abstract
X-ray production cross sections were found for films of Cr, Cu, Ge, Ag, W and Au, using incident H+ and Be+ ions at energies from 300 keV to 3.5 MeV. These experimental cross section results were compared with the cross section results obtained using software which calculates inner shell ionization and X-ray production cross sections. The software uses the ECPSSR-UA approach to finding X-ray production cross sections. This program was found to be useful for predicting cross sections for H+ and Be+ ions at the energies in this study. The software was then used to predict results for Li+, Be+ and B+ ions at 280 keV, energies available in the Arizona State University focused ion beam laboratory.
Original language | English (US) |
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Pages (from-to) | 92-94 |
Number of pages | 3 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 249 |
Issue number | 1-2 SPEC. ISS. |
DOIs | |
State | Published - Aug 2006 |
Keywords
- FIB
- FIB-PIXE
- Focused ion beam
- PIXE
- Particle induced X-ray emission
- X-ray emission
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation