Experimental methods and data analysis for fluctuation microscopy

P. M. Voyles, Michael Treacy, J. M. Gibson, H. C. Jin, J. R. Abelson

Research output: Chapter in Book/Report/Conference proceedingChapter

9 Citations (Scopus)

Abstract

We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
Pages155-160
Number of pages6
Volume589
StatePublished - 2000
Externally publishedYes

Fingerprint

Imaging systems
Metal foil
Electron microscopy
Statistical methods
Microscopic examination
Electrons

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Voyles, P. M., Treacy, M., Gibson, J. M., Jin, H. C., & Abelson, J. R. (2000). Experimental methods and data analysis for fluctuation microscopy. In Materials Research Society Symposium - Proceedings (Vol. 589, pp. 155-160)

Experimental methods and data analysis for fluctuation microscopy. / Voyles, P. M.; Treacy, Michael; Gibson, J. M.; Jin, H. C.; Abelson, J. R.

Materials Research Society Symposium - Proceedings. Vol. 589 2000. p. 155-160.

Research output: Chapter in Book/Report/Conference proceedingChapter

Voyles, PM, Treacy, M, Gibson, JM, Jin, HC & Abelson, JR 2000, Experimental methods and data analysis for fluctuation microscopy. in Materials Research Society Symposium - Proceedings. vol. 589, pp. 155-160.
Voyles PM, Treacy M, Gibson JM, Jin HC, Abelson JR. Experimental methods and data analysis for fluctuation microscopy. In Materials Research Society Symposium - Proceedings. Vol. 589. 2000. p. 155-160
Voyles, P. M. ; Treacy, Michael ; Gibson, J. M. ; Jin, H. C. ; Abelson, J. R. / Experimental methods and data analysis for fluctuation microscopy. Materials Research Society Symposium - Proceedings. Vol. 589 2000. pp. 155-160
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