Experimental methods and data analysis for fluctuation microscopy

P. M. Voyles; Michael Treacy; J. M. Gibson; H. C. Jin; J. R. Abelson

Experimental methods and data analysis for fluctuation microscopy

P. M. Voyles, Michael Treacy, J. M. Gibson, H. C. Jin, J. R. Abelson

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

Original language	English (US)
Title of host publication	Materials Research Society Symposium - Proceedings
Pages	155-160
Number of pages	6
Volume	589
State	Published - 2000
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Cite this

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title = "Experimental methods and data analysis for fluctuation microscopy",

abstract = "We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.",

author = "Voyles, {P. M.} and Michael Treacy and Gibson, {J. M.} and Jin, {H. C.} and Abelson, {J. R.}",

year = "2000",

language = "English (US)",

volume = "589",

pages = "155--160",

booktitle = "Materials Research Society Symposium - Proceedings",

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TY - CHAP

T1 - Experimental methods and data analysis for fluctuation microscopy

AU - Voyles, P. M.

AU - Treacy, Michael

AU - Gibson, J. M.

AU - Jin, H. C.

AU - Abelson, J. R.

PY - 2000

Y1 - 2000

N2 - We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

AB - We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

UR - http://www.scopus.com/inward/record.url?scp=0035206519&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035206519&partnerID=8YFLogxK

M3 - Chapter

AN - SCOPUS:0035206519

VL - 589

SP - 155

EP - 160

BT - Materials Research Society Symposium - Proceedings

ER -

Experimental methods and data analysis for fluctuation microscopy

Abstract

ASJC Scopus subject areas

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