Experimental low-voltage-point projection microscopy

John Spence, W. Qian, Jingyue Liu, W. Lo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper presents an atomic resolution achieved by low voltage point projection microscopy. Since resolution is approximately equal to virtual source size, it demonstrates field-emission from tip regions of atomic dimensions. Ray-tracing calculations show the aberration coefficients and size of the virtual source to be sub nanometer. The brightness of such a nanotip has been measured to be 7.7 × 10 10 A cm -2 sr -1 (at 100kV). The images require the theory of LEED for interpretation and are always out of focus by the tip to sample distance z1. The instruments hold promise for imaging small organic molecules (across holey carbon grid), LB and other thin organic films where radiation damage is dominated by inner-shell processes.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages1060-1061
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

    Fingerprint

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Spence, J., Qian, W., Liu, J., & Lo, W. (1993). Experimental low-voltage-point projection microscopy. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 1060-1061). Publ by San Francisco Press Inc.