Experimental design for robust process control using Schroeder-phased input signals

Daniel Rivera, Xiangqin Chen, David S. Bayard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

The use of Schroeder-phased, multisinusoid input signals for system identification in the process industries is described in this paper. We show that the Schroeder-phased input displays a number of significant properties which make it an attractive alternative to the PRBS input for identification in the presence of noise.

Original languageEnglish (US)
Title of host publicationAmerican Control Conference
Editors Anon
Place of PublicationPiscataway, NJ, United States
PublisherPubl by IEEE
Pages895-899
Number of pages5
ISBN (Print)0780308611
StatePublished - 1993
EventProceedings of the 1993 American Control Conference Part 3 (of 3) - San Francisco, CA, USA
Duration: Jun 2 1993Jun 4 1993

Other

OtherProceedings of the 1993 American Control Conference Part 3 (of 3)
CitySan Francisco, CA, USA
Period6/2/936/4/93

Fingerprint

Design of experiments
Process control
Identification (control systems)
Industry

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Rivera, D., Chen, X., & Bayard, D. S. (1993). Experimental design for robust process control using Schroeder-phased input signals. In Anon (Ed.), American Control Conference (pp. 895-899). Piscataway, NJ, United States: Publ by IEEE.

Experimental design for robust process control using Schroeder-phased input signals. / Rivera, Daniel; Chen, Xiangqin; Bayard, David S.

American Control Conference. ed. / Anon. Piscataway, NJ, United States : Publ by IEEE, 1993. p. 895-899.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rivera, D, Chen, X & Bayard, DS 1993, Experimental design for robust process control using Schroeder-phased input signals. in Anon (ed.), American Control Conference. Publ by IEEE, Piscataway, NJ, United States, pp. 895-899, Proceedings of the 1993 American Control Conference Part 3 (of 3), San Francisco, CA, USA, 6/2/93.
Rivera D, Chen X, Bayard DS. Experimental design for robust process control using Schroeder-phased input signals. In Anon, editor, American Control Conference. Piscataway, NJ, United States: Publ by IEEE. 1993. p. 895-899
Rivera, Daniel ; Chen, Xiangqin ; Bayard, David S. / Experimental design for robust process control using Schroeder-phased input signals. American Control Conference. editor / Anon. Piscataway, NJ, United States : Publ by IEEE, 1993. pp. 895-899
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