Abstract
We have used magnetometry and resonant soft x-ray magnetic reflectometry to determine the depth-dependent charge and magnetization density on an absolute scale across a Permalloy/CoO interface above the Néel temperature of CoO. A thin magnetic layer of 1.0 nm forms at the interface. This layer has larger magnetization density and different temperature dependence of magnetization than Permalloy.
Original language | English (US) |
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Article number | 014442 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 75 |
Issue number | 1 |
DOIs | |
State | Published - Jan 31 2007 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics