We have used magnetometry and resonant soft x-ray magnetic reflectometry to determine the depth-dependent charge and magnetization density on an absolute scale across a Permalloy/CoO interface above the Néel temperature of CoO. A thin magnetic layer of 1.0 nm forms at the interface. This layer has larger magnetization density and different temperature dependence of magnetization than Permalloy.
|Original language||English (US)|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|State||Published - Jan 31 2007|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics