Fingerprint
Dive into the research topics of 'Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies
A. Privat, H. J. Barnaby, M. Spear, M. Esposito, J. E. Manuel, L. Clark, J. Brunhaver, A. Duvnjak, R. Jokai, K. E. Holbert, M. L. McLain, M. J. Marinella, M. P. King
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations