Evidence for solid-state effects in the electronic structure of C60 films: a resonance-Raman study

K. Sinha, Jose Menendez, R. C. Hanson, G. B. Adams, J. B. Page, O. F. Sankey, L. D. Lamb, D. R. Huffman

Research output: Contribution to journalArticlepeer-review

35 Scopus citations


The Raman excitation profiles for C60 films grown on silicon reveal the existence of optical transitions near 2.4 eV, well below the lowest dipole-allowed absorption line predicted for isolated icosahedral molecules. These transitions are not observed in C60 dissolved in CS2. We propose an explanation in terms of a breakdown of the icosahedral inversion symmetry in C60 crystals.

Original languageEnglish (US)
Pages (from-to)287-290
Number of pages4
JournalChemical Physics Letters
Issue number2-3
StatePublished - Nov 8 1991

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Fingerprint Dive into the research topics of 'Evidence for solid-state effects in the electronic structure of C<sub>60</sub> films: a resonance-Raman study'. Together they form a unique fingerprint.

Cite this