Evaluation of an accelerated ELDRS test using molecular hydrogen

Ronald L. Pease, Philippe C. Adell, Bernard Rax, Steven McClure, Hugh Barnaby, Kirby Kruckmeyer, B. Triggs

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened ELDRS-free part types have been tested using this same approach to see if the test is overly conservative.

Original languageEnglish (US)
Article number5624628
Pages (from-to)3419-3425
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume57
Issue number6 PART 1
DOIs
StatePublished - Dec 2010

Fingerprint

Hardness
Radiation
dosage
Hydrogen
Networks (circuits)
evaluation
hydrogen
linear circuits
assurance
hardness
radiation

Keywords

  • Bipolar linear circuits
  • discrete bipolar transistors
  • dose rate
  • enhanced low-dose-rate sensitivity (ELDRS)
  • hydrogen
  • radiation effects
  • total ionizing dose

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

Cite this

Pease, R. L., Adell, P. C., Rax, B., McClure, S., Barnaby, H., Kruckmeyer, K., & Triggs, B. (2010). Evaluation of an accelerated ELDRS test using molecular hydrogen. IEEE Transactions on Nuclear Science, 57(6 PART 1), 3419-3425. [5624628]. https://doi.org/10.1109/TNS.2010.2070806

Evaluation of an accelerated ELDRS test using molecular hydrogen. / Pease, Ronald L.; Adell, Philippe C.; Rax, Bernard; McClure, Steven; Barnaby, Hugh; Kruckmeyer, Kirby; Triggs, B.

In: IEEE Transactions on Nuclear Science, Vol. 57, No. 6 PART 1, 5624628, 12.2010, p. 3419-3425.

Research output: Contribution to journalArticle

Pease, RL, Adell, PC, Rax, B, McClure, S, Barnaby, H, Kruckmeyer, K & Triggs, B 2010, 'Evaluation of an accelerated ELDRS test using molecular hydrogen', IEEE Transactions on Nuclear Science, vol. 57, no. 6 PART 1, 5624628, pp. 3419-3425. https://doi.org/10.1109/TNS.2010.2070806
Pease RL, Adell PC, Rax B, McClure S, Barnaby H, Kruckmeyer K et al. Evaluation of an accelerated ELDRS test using molecular hydrogen. IEEE Transactions on Nuclear Science. 2010 Dec;57(6 PART 1):3419-3425. 5624628. https://doi.org/10.1109/TNS.2010.2070806
Pease, Ronald L. ; Adell, Philippe C. ; Rax, Bernard ; McClure, Steven ; Barnaby, Hugh ; Kruckmeyer, Kirby ; Triggs, B. / Evaluation of an accelerated ELDRS test using molecular hydrogen. In: IEEE Transactions on Nuclear Science. 2010 ; Vol. 57, No. 6 PART 1. pp. 3419-3425.
@article{aec04f19b74e417b89e3087d6d752347,
title = "Evaluation of an accelerated ELDRS test using molecular hydrogen",
abstract = "An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened ELDRS-free part types have been tested using this same approach to see if the test is overly conservative.",
keywords = "Bipolar linear circuits, discrete bipolar transistors, dose rate, enhanced low-dose-rate sensitivity (ELDRS), hydrogen, radiation effects, total ionizing dose",
author = "Pease, {Ronald L.} and Adell, {Philippe C.} and Bernard Rax and Steven McClure and Hugh Barnaby and Kirby Kruckmeyer and B. Triggs",
year = "2010",
month = "12",
doi = "10.1109/TNS.2010.2070806",
language = "English (US)",
volume = "57",
pages = "3419--3425",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6 PART 1",

}

TY - JOUR

T1 - Evaluation of an accelerated ELDRS test using molecular hydrogen

AU - Pease, Ronald L.

AU - Adell, Philippe C.

AU - Rax, Bernard

AU - McClure, Steven

AU - Barnaby, Hugh

AU - Kruckmeyer, Kirby

AU - Triggs, B.

PY - 2010/12

Y1 - 2010/12

N2 - An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened ELDRS-free part types have been tested using this same approach to see if the test is overly conservative.

AB - An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened ELDRS-free part types have been tested using this same approach to see if the test is overly conservative.

KW - Bipolar linear circuits

KW - discrete bipolar transistors

KW - dose rate

KW - enhanced low-dose-rate sensitivity (ELDRS)

KW - hydrogen

KW - radiation effects

KW - total ionizing dose

UR - http://www.scopus.com/inward/record.url?scp=78650416545&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78650416545&partnerID=8YFLogxK

U2 - 10.1109/TNS.2010.2070806

DO - 10.1109/TNS.2010.2070806

M3 - Article

AN - SCOPUS:78650416545

VL - 57

SP - 3419

EP - 3425

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 6 PART 1

M1 - 5624628

ER -