Evaluation of an accelerated ELDRS test using molecular hydrogen

Ronald L. Pease, Philippe C. Adell, Bernard Rax, Steven McClure, Hugh Barnaby, Kirby Kruckmeyer, B. Triggs

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened ELDRS-free part types have been tested using this same approach to see if the test is overly conservative.

Original languageEnglish (US)
Article number5624628
Pages (from-to)3419-3425
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume57
Issue number6 PART 1
DOIs
StatePublished - Dec 1 2010

Keywords

  • Bipolar linear circuits
  • discrete bipolar transistors
  • dose rate
  • enhanced low-dose-rate sensitivity (ELDRS)
  • hydrogen
  • radiation effects
  • total ionizing dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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