@article{aec04f19b74e417b89e3087d6d752347,
title = "Evaluation of an accelerated ELDRS test using molecular hydrogen",
abstract = "An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened ELDRS-free part types have been tested using this same approach to see if the test is overly conservative.",
keywords = "Bipolar linear circuits, discrete bipolar transistors, dose rate, enhanced low-dose-rate sensitivity (ELDRS), hydrogen, radiation effects, total ionizing dose",
author = "Pease, {Ronald L.} and Adell, {Philippe C.} and Bernard Rax and Steven McClure and Hugh Barnaby and Kirby Kruckmeyer and B. Triggs",
note = "Funding Information: Manuscript received July 09, 2010; revised August 17, 2010; accepted August 18, 2010. Date of publication November 09, 2010; date of current version December 15, 2010. This work was supported by the Defense Threat Reduction Agency through Contract HDTRA1-09-C-0036 with Micro RDC and by the NASA Electronic Parts and Packaging Program. R. L. Pease is with RLP Research, Los Lunas, NM 87031 USA (e-mail: lsrlpease@wildblue.net). P. C. Adell, B. Rax, and S. McClure are with the Jet Propulsion Laboratory, Pasadena, CA 91109 USA (e-mail: philippe.c.adell@jpl.nasa.gov; benard.g.rax@jpl.nasa.gov; stephen.s.mcclure@jpl.nasa.gov). H. J. Barnaby is with Arizona State University, Tempe, AZ 85287 USA (e-mail: hbarnaby@asu.edu). K. Kruckmeyer is with National Semiconductor, Santa Clara, CA 95052 USA (e-mail: Kirby.kruckmeyer@nsc.com). B. Triggs is with the Semicoa Corporation, Costa Mesa, CA 92626 USA (e-mail: btriggs@semicoa.com). Digital Object Identifier 10.1109/TNS.2010.2070806",
year = "2010",
month = dec,
doi = "10.1109/TNS.2010.2070806",
language = "English (US)",
volume = "57",
pages = "3419--3425",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6 PART 1",
}