Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits

Y. Deval, H. Lapuyade, P. Fouillat, Hugh Barnaby, F. Darracq, R. Briand, D. Lewis, R. D. Schrimpf

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This noninvasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high levels of dose rates can be experimentally simulated.

Original languageEnglish (US)
Pages (from-to)1468-1473
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume49 III
Issue number3
DOIs
StatePublished - Jun 2002
Externally publishedYes

Fingerprint

linear integrated circuits
Laser beam effects
Photocurrents
methodology
Degradation
dosage
Networks (circuits)
evaluation
Substrates
photocurrents
degradation
irradiation
electronics
lasers
Analog integrated circuits

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits. / Deval, Y.; Lapuyade, H.; Fouillat, P.; Barnaby, Hugh; Darracq, F.; Briand, R.; Lewis, D.; Schrimpf, R. D.

In: IEEE Transactions on Nuclear Science, Vol. 49 III, No. 3, 06.2002, p. 1468-1473.

Research output: Contribution to journalArticle

Deval, Y, Lapuyade, H, Fouillat, P, Barnaby, H, Darracq, F, Briand, R, Lewis, D & Schrimpf, RD 2002, 'Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits', IEEE Transactions on Nuclear Science, vol. 49 III, no. 3, pp. 1468-1473. https://doi.org/10.1109/TNS.2002.1039685
Deval, Y. ; Lapuyade, H. ; Fouillat, P. ; Barnaby, Hugh ; Darracq, F. ; Briand, R. ; Lewis, D. ; Schrimpf, R. D. / Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits. In: IEEE Transactions on Nuclear Science. 2002 ; Vol. 49 III, No. 3. pp. 1468-1473.
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