Evaluating the Properties of Millimeter- And THz Wave Scattering from Common Rough Surfaces

Yiran Cui, Murali Krishna Immadisetty, Georgios C. Trichopoulos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A simple numerical approach is presented to estimate rough surface scattering. We measure the roughness parameters of rough surfaces and then import them into a 2D model to compute the scattered fields under various surface illuminations. The validity of this approach is demonstrated by comparing the simulation results with measurements. Besides, we use the 2D model to simulate rough surfaces of a wide range of roughness parameters and perform a qualitative analysis on the scattering patterns. We show that, for most common building materials of moderate roughness, increasing the root-mean-square height of the rough surface reduces the maximum reflection and increases diffuse scattering. On the other hand, increasing the correlation length of the rough surface will lead to lower maximum reflection and diffuse scattering.

Original languageEnglish (US)
Title of host publication2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, IEEECONF 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1117-1118
Number of pages2
ISBN (Electronic)9781728166704
DOIs
StatePublished - Jul 5 2020
Event2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, IEEECONF 2020 - Virtually, Toronto, Canada
Duration: Jul 5 2020Jul 10 2020

Publication series

Name2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, IEEECONF 2020 - Proceedings

Conference

Conference2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, IEEECONF 2020
Country/TerritoryCanada
CityVirtually, Toronto
Period7/5/207/10/20

Keywords

  • millimeter waves
  • rough surface
  • scattering
  • terahertz waves

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Instrumentation

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