Error analysis and correction in a beam profile monitor

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.

Original languageEnglish (US)
Pages (from-to)19-26
Number of pages8
JournalNuclear Inst. and Methods in Physics Research, A
Volume364
Issue number1
DOIs
StatePublished - Sep 21 1995
Externally publishedYes

Fingerprint

error analysis
Error correction
Error analysis
monitors
boosters
profiles
computerized simulation
Computer simulation
Ions
ions
Experiments

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Error analysis and correction in a beam profile monitor. / Graves, William.

In: Nuclear Inst. and Methods in Physics Research, A, Vol. 364, No. 1, 21.09.1995, p. 19-26.

Research output: Contribution to journalArticle

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