Erratum: (Ultrafast Phenomena in Semiconductors II (28-29 January 1998))

Kong Thon Tsen, Harold R. Fetterman

Research output: Contribution to journal › Comment/debate

Original language	English (US)
Number of pages	1
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3277
State	Published - Dec 1 1998
Event	Ultrafast Phenomena in Semiconductors II - San Jose, CA, United States Duration: Jan 28 1998 → Jan 29 1998

Cite this

@article{ec0bc436da1b4eb3a7b216855e87d4e3,

title = "Erratum: (Ultrafast Phenomena in Semiconductors II (28-29 January 1998))",

author = "Tsen, {Kong Thon} and Fetterman, {Harold R.}",

year = "1998",

month = dec,

day = "1",

language = "English (US)",

volume = "3277",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Ultrafast Phenomena in Semiconductors II ; Conference date: 28-01-1998 Through 29-01-1998",

}

TY - JOUR

T1 - Erratum

T2 - Ultrafast Phenomena in Semiconductors II

AU - Tsen, Kong Thon

AU - Fetterman, Harold R.

PY - 1998/12/1

Y1 - 1998/12/1

UR - http://www.scopus.com/inward/record.url?scp=0032225844&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032225844&partnerID=8YFLogxK

M3 - Comment/debate

AN - SCOPUS:0032225844

VL - 3277

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

Y2 - 28 January 1998 through 29 January 1998

ER -