Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials

S. M. Collins, R. K. Leary, P. A. Midgley, R. Tovey, M. Benning, C. B. Schönlieb, Peter Rez, Michael Treacy

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Electron tomography bears promise for widespread determination of the three-dimensional arrangement of atoms in solids. However, it remains unclear whether methods successful for crystals are optimal for amorphous solids. Here, we explore the relative difficulty encountered in atomic-resolution tomography of crystalline and amorphous nanoparticles. We define an informational entropy to reveal the inherent importance of low-entropy zone-axis projections in the reconstruction of crystals. In turn, we propose considerations for optimal sampling for tomography of ordered and disordered materials.

Original languageEnglish (US)
Article number166101
JournalPhysical Review Letters
Volume119
Issue number16
DOIs
StatePublished - Oct 16 2017

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amorphous materials
tomography
entropy
crystals
electrons
bears
projection
sampling
nanoparticles
atoms

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials. / Collins, S. M.; Leary, R. K.; Midgley, P. A.; Tovey, R.; Benning, M.; Schönlieb, C. B.; Rez, Peter; Treacy, Michael.

In: Physical Review Letters, Vol. 119, No. 16, 166101, 16.10.2017.

Research output: Contribution to journalArticle

Collins, S. M. ; Leary, R. K. ; Midgley, P. A. ; Tovey, R. ; Benning, M. ; Schönlieb, C. B. ; Rez, Peter ; Treacy, Michael. / Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials. In: Physical Review Letters. 2017 ; Vol. 119, No. 16.
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