Enhancing the resolution and sensitivity of STEM by aberration correction

Nigel D. Browning, K. Sun, R. F. Klie, J. Liu, M. M. Disko, P. D. Nellist, N. Dellby, O. L. Krivanek

Research output: Contribution to journalArticle

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)18-19
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
DOIs
StatePublished - 2002
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

Cite this

Browning, N. D., Sun, K., Klie, R. F., Liu, J., Disko, M. M., Nellist, P. D., Dellby, N., & Krivanek, O. L. (2002). Enhancing the resolution and sensitivity of STEM by aberration correction. Microscopy and Microanalysis, 8(SUPPL. 2), 18-19. https://doi.org/10.1017/s1431927602101528