Abstract

We investigate optical properties of various aspect-ratio Si nauopillar (Si NP) to find its optimal dimension for enhanced light absorption for thin Si solar cell applications. Two different optical modeling techniques, finite-difference time-domain (TDTD) and rigorous coupled wave analysis (RCWA). are used to analyze the scattering properties of incident light and the diffraction behavior of transmitted light, respectively. From the computational study, we find that a low-aspect ratio Si NP is highly effective compared to high aspect-ratio NPs in terms of forward scattering to suppress light reflection loss from the front surface. In addition, low aspect-ratio NPs also significantly diminishes zeroth (0th) order diffraction and increase the fraction of higher order diffraction which can provide increased light path-length and effective light trapping of the transmitted light. Therefore, a low-aspect ratio Si NP is more ideal for highly enhanced light absorption for thin Si solar cell applications.

Original languageEnglish (US)
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479979448
DOIs
StatePublished - Dec 14 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: Jun 14 2015Jun 19 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period6/14/156/19/15

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Keywords

  • light trapping
  • nanophotonics
  • optical diffraction
  • photovoltaic
  • silicon

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Choi, J. Y., Viilic, N., Goodnick, S., & Honsberg, C. (2015). Enhanced forward scattering and transmitted light diffraction in low aspect-ratio Si nanopillars for high efficiency Si solar cells. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 [7356120] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7356120