Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers

Erkan Acar, Sule Ozev, Kevin B. Redmond

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Scopus citations

Abstract

As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable percentage of the overall cost, which typically results from the high number of specifications, the high number of distinct test set-ups and equipment pieces that need to be used, and the high cost of each test set-up. In this paper, we investigate the versatility of EVM measurements to test the variable-envelope WLAN (Wireless Local Area Networks) receiver and transmitter characteristics. The goal is to optimize EVM test parameters (input data and test limits) and to reduce the number of specification measurements that require high test times and/or expensive test equipment. Our analysis shows that enhanced EVM measurements(optimized data sequence and limits, use of RMS, scale, and phase error vector values) in conjunction with a set of simple path measurements (input-output impedances) can provide the desired fault coverage while eliminating lengthy spectrum mask and noise figure tests

Original languageEnglish (US)
Title of host publicationProceedings of the 2006 International Conference on Computer-Aided Design, ICCAD
Pages210-216
Number of pages7
DOIs
StatePublished - Dec 1 2006
Externally publishedYes
Event2006 International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
Duration: Nov 5 2006Nov 9 2006

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Other

Other2006 International Conference on Computer-Aided Design, ICCAD
CountryUnited States
CitySan Jose, CA
Period11/5/0611/9/06

ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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  • Cite this

    Acar, E., Ozev, S., & Redmond, K. B. (2006). Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. In Proceedings of the 2006 International Conference on Computer-Aided Design, ICCAD (pp. 210-216). [4110176] (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2006.320138