Abstract

Small amounts of copper were added to enhance the adhesion and minimize agglomeration of Ag thin films on SiO2 substrates. Comparison of texture profiles between Ag and Ag(Cu) thin films showed that Cu additions enhanced (111) texture in Ag thin films. For the case of Ag film, (111) texture was enhanced mainly by recrystallization of amorphous regions during annealing. In addition to the recrystallization, (111) texture enhancement in Ag(Cu) film attributes to the dissociation of grains with other crystallographic orientations.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
Pages141-146
Number of pages6
Volume990
StatePublished - 2007
Event2007 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 10 2007Apr 12 2007

Other

Other2007 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/10/074/12/07

Fingerprint

Textures
Thin films
Copper
Adhesion
Agglomeration
Annealing
Substrates

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Zoo, Y., Han, H., & Alford, T. (2007). Enhanced [111] preferred orientation of Ag thin film on amorphous SiO 2 by Cu addition. In Materials Research Society Symposium Proceedings (Vol. 990, pp. 141-146)

Enhanced [111] preferred orientation of Ag thin film on amorphous SiO 2 by Cu addition. / Zoo, Yeongseok; Han, Hauk; Alford, Terry.

Materials Research Society Symposium Proceedings. Vol. 990 2007. p. 141-146.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zoo, Y, Han, H & Alford, T 2007, Enhanced [111] preferred orientation of Ag thin film on amorphous SiO 2 by Cu addition. in Materials Research Society Symposium Proceedings. vol. 990, pp. 141-146, 2007 MRS Spring Meeting, San Francisco, CA, United States, 4/10/07.
Zoo Y, Han H, Alford T. Enhanced [111] preferred orientation of Ag thin film on amorphous SiO 2 by Cu addition. In Materials Research Society Symposium Proceedings. Vol. 990. 2007. p. 141-146
Zoo, Yeongseok ; Han, Hauk ; Alford, Terry. / Enhanced [111] preferred orientation of Ag thin film on amorphous SiO 2 by Cu addition. Materials Research Society Symposium Proceedings. Vol. 990 2007. pp. 141-146
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