Energy-filtered chemical mapping: Current applications to materials science

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Scopus citations

    Abstract

    Elemental mapping is a powerful technique for elucidating the distribution of elements on the nanometer scale in materials with complex morphologies. For many applications in materials science, it is important to sample a statistically meaningful area of the specimen under study. A conventional transmission electron microscope (TEM) equipped with an energy filter is suited to this requirement at intermediate resolution because the electron beam current is two orders of magnitude greater than that from a field electron gun (FEG) scanning TEM (STEM). Recent advances in spectrometer design and digital image recording have stimulated renewed interest in energy-filtered imaging and elemental mapping with a conventional TEM.

    Original languageEnglish (US)
    Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
    EditorsG.W. Bailey, A.J. Garratt-Reed
    Pages958-959
    Number of pages2
    StatePublished - 1994
    EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
    Duration: Jul 31 1994Aug 5 1994

    Other

    OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
    CityNew Orleans, LA, USA
    Period7/31/948/5/94

    ASJC Scopus subject areas

    • Engineering(all)

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