Abstract
Elemental mapping is a powerful technique for elucidating the distribution of elements on the nanometer scale in materials with complex morphologies. For many applications in materials science, it is important to sample a statistically meaningful area of the specimen under study. A conventional transmission electron microscope (TEM) equipped with an energy filter is suited to this requirement at intermediate resolution because the electron beam current is two orders of magnitude greater than that from a field electron gun (FEG) scanning TEM (STEM). Recent advances in spectrometer design and digital image recording have stimulated renewed interest in energy-filtered imaging and elemental mapping with a conventional TEM.
| Original language | English (US) |
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| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Editors | G.W. Bailey, A.J. Garratt-Reed |
| Pages | 958-959 |
| Number of pages | 2 |
| State | Published - 1994 |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
| Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- General Engineering